Local scanning device and method based on industrial CT

Abstract

The invention provides a local scanning device and method based on an industrial CT. The local scanning device and method are used for scanning local interested areas of a tested object. The local scanning device comprises a coordinate linkage system arranged between a radiation source and a detector. The coordinate linkage system comprises an X-axis linkage device and a Y-axis linkage device, wherein the X-axis linkage device and the Y-axis linkage device are arranged on the transverse position and the longitudinal position of a linkage platform respectively to prove a first revolution freedom degree, a carrying table is arranged above the linkage platform to provide a second autorotation freedom degree and used for carrying the tested object, and a tracking scanning device is connected with the carrying table, the Y-axis linkage device and the X-axis linkage device to control linkage to be formed between the first revolution freedom degree of the linkage platform and the second autorotation freedom degree of the carrying table till the local interested area of the tested object reaches the detecting range of the radiation source, and 360-degree circumferential scanning of the local interested area is kept.

Description

technical field [0001] The invention relates to a CT scanning device and method based on industrial use, in particular to a CT scanning device capable of tracking a local area of ​​a measured object in a plane coordinate system and a scanning method thereof. Background technique [0002] Industrial CT (industrial computerized tomography) refers to nuclear imaging technology applied in industry. The basic principle is based on the attenuation and absorption characteristics of radiation in the object to be detected, using X-rays or gamma rays with a certain energy and intensity emitted by radionuclides or other radiation sources to produce attenuation after passing through the object to be detected After being captured by the detector, the tomographic information of the measured object is obtained, so as to understand the internal detailed information or internal and external contour information of the measured object, and display it in the form of an image through computer in...

AI Technical Summary

Problems solved by technology

As a result, the size range of detectable irregular products is greatly reduced

[0009] On the other hand, in terms of the detection principle, the offset scanning method essentially scans the entire abnormal-shaped product (including the local area of ​​interest), which increases the scanning, reconstruction and analysis time and reduces the scanning efficiency.

At the same time, special algorithms are required for data splicing, which affects the final scanning quality and efficiency

[0010] On the other hand, the existing technology is also unable to realize simultaneous tracking and detection for multiple local interest areas of the same special-shaped product. The placement position on the stage is adjusted, so the whole detection process is extremely cumbersome

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