Circuit Health Grading Evaluation Method Combining Correlation Relationship and Gray Clustering Technology

A grey clustering and correlation technology, applied in electrical digital data processing, instruments, design optimization/simulation, etc., can solve problems such as economic loss, loss, mission failure, etc., and achieve the effect of accurate evaluation results

Active Publication Date: 2019-07-09
BEIHANG UNIV
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

In this state, if the system is stopped, it may cause huge economic losses and lead to task failure; but if the system is allowed to continue to work without taking corrective measures, it may cause failure due to this "sub-health" state. Anticipated serious loss and damage

Method used

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  • Circuit Health Grading Evaluation Method Combining Correlation Relationship and Gray Clustering Technology
  • Circuit Health Grading Evaluation Method Combining Correlation Relationship and Gray Clustering Technology
  • Circuit Health Grading Evaluation Method Combining Correlation Relationship and Gray Clustering Technology

Examples

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Embodiment

[0087] Taking a certain three-stage filter circuit as an example below, the method of the present invention will be described. The schematic diagram of the circuit is as follows image 3 shown.

[0088] The circuit consists of three main functional blocks:

[0089] (1) U 1 : primary circuit;

[0090] (2) U 2 : secondary amplifier circuit;

[0091] (3) U 3 : Three-stage amplifier circuit;

[0092] In the simulation model circuit, the signal source is a DC signal with a voltage of 3mV.

[0093] Step 1: Determine the observation index and health classification of the circuit

[0094] (1.1) There are 3 voltage monitoring points in the circuit, which are respectively located at the output of each amplifier circuit, as follows:

[0095] Table 6 Range of observation index changes in the three states of the system

[0096] monitoring unit Primary circuit U 1

Secondary amplifier circuit U 2

Three-stage amplifier circuit U 3

Monitoring indicator...

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Abstract

The invention provides a circuit health ranking evaluation method in combination with dependency relation and gray clustering technology, and belongs to the technical field of fault diagnosis. The method comprises the following steps: firstly determining an observation index and the health rank of the circuit, establishing a dependency graphical model to obtain a dependency matrix, using the dependency matrix to determine the optimal observation index and the weight thereof, and establishing a whitening function of the observation index through simulation, and finally acquiring an observation value of a circuit to be detected object, performing clustering coefficient computation to finish the health ranking evaluation. The dependency matrix is used for extracting the optimal observation index and determining the corresponding index weight, so that the weight can reflect the sensitive degree of the index to the circuit stage change, the whitening function is obtained through the simulation, and the gray clustering health ranking is implemented according to measured data; the evaluation result is accurate and meets the actual condition.

Description

technical field [0001] The invention relates to a circuit health grading evaluation method combining correlation relationship and gray clustering technology, belonging to the technical field of fault diagnosis. Background technique [0002] Various existing systems or products in different fields are increasingly highly integrated and modularized, with more and more functions, and more and more complex structures and levels. Many of these factors are not fatal to the normal operation of the system. Once these factors If an exception or failure occurs, the system will enter a "sub-healthy" state. In this state, if the system is stopped, it may cause huge economic losses and lead to task failure; but if the system is allowed to continue to work without taking corrective measures, it may cause failure due to this "sub-health" state. Anticipated severe loss and damage. [0003] Health grading assessment is a new development direction of fault diagnosis technology. Through heal...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/50
CPCG06F30/20
Inventor 石君友王佳婧邓怡
Owner BEIHANG UNIV
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