A Method for Estimating the Location Parameters of Target Scattering Center
A center position and target scattering technology, which is applied in the direction of measuring devices, using re-radiation, radio wave reflection/re-radiation, etc., can solve the problems of misjudgment of local peak points as scattering centers and limited estimation accuracy of location parameters of scattering centers
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[0030] Exemplary embodiments of the present invention will be described in detail below with reference to the accompanying drawings. The description of the exemplary embodiments is for the purpose of illustration only, and in no way limits the invention and its application or usage.
[0031] The scattering center of the target appears as local peak points on the two-dimensional image. At the same time, background interference may also cause local peak points to appear on the image. Because the existing methods for estimating target scattering centers cannot distinguish the peak points caused by background interference and scattering centers, there are problems of high misjudgment rate and low accuracy.
[0032] In view of the defects of the prior art, the inventors of the present application thought that the position of the local peak point corresponding to the scattering center of the target does not change with the change of frequency, while the position of the local peak p...
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