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A Method for Estimating the Location Parameters of Target Scattering Center

A center position and target scattering technology, which is applied in the direction of measuring devices, using re-radiation, radio wave reflection/re-radiation, etc., can solve the problems of misjudgment of local peak points as scattering centers and limited estimation accuracy of location parameters of scattering centers

Active Publication Date: 2018-04-17
BEIJING INST OF ENVIRONMENTAL FEATURES
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Problems solved by technology

Using this method to obtain the location information of the target scattering center has two disadvantages: one is that the local peak point caused by background interference may be misjudged as the scattering center; the other is that the estimation accuracy of the location parameters of the scattering center is limited

Method used

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  • A Method for Estimating the Location Parameters of Target Scattering Center
  • A Method for Estimating the Location Parameters of Target Scattering Center
  • A Method for Estimating the Location Parameters of Target Scattering Center

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Embodiment Construction

[0030] Exemplary embodiments of the present invention will be described in detail below with reference to the accompanying drawings. The description of the exemplary embodiments is for the purpose of illustration only, and in no way limits the invention and its application or usage.

[0031] The scattering center of the target appears as local peak points on the two-dimensional image. At the same time, background interference may also cause local peak points to appear on the image. Because the existing methods for estimating target scattering centers cannot distinguish the peak points caused by background interference and scattering centers, there are problems of high misjudgment rate and low accuracy.

[0032] In view of the defects of the prior art, the inventors of the present application thought that the position of the local peak point corresponding to the scattering center of the target does not change with the change of frequency, while the position of the local peak p...

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Abstract

Disclosed is a method of estimating target scattering center position parameters, comprising: dividing scattering echo data with a Bz bandwidth into M frequency domain sections, and separately imaging data in the M frequency domain sections to obtain M subimages; and separately determining local peak points of the M subimages, and employing the local peak point appearing in each of the M subimages as a first estimation point of a target scattering center. According to the technical scheme, the method can effectively distinguish peak points generated by the scattering center from the peak points generated by background interference so as to reduce a misjudgment rate of the scattering center, and improve the estimation precision of scattering center position parameters.

Description

technical field [0001] The invention relates to the field of target recognition of SAR or ISAR images, in particular to a method for estimating position parameters of target scattering centers. Background technique [0002] The scattering center of the target appears as local peak points one by one on the two-dimensional ISAR (Inverse Synthetic Aperture Radar) or ISR (Synthetic Aperture Radar) image. In the existing image-based method for estimating the target scattering center, the local peak point judgment is often performed on a two-dimensional image, and the position of the local peak point determined by the judgment is used as the position of the target scattering center. There are two disadvantages in using this method to obtain the location information of the target scattering center: one is that the local peak point caused by background interference may be misjudged as the scattering center; the other is that the estimation accuracy of the location parameters of the ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01S13/90G01S7/41
CPCG01S7/41G01S13/90G01S13/9064G01S13/9027
Inventor 邢笑宇霍超颖袁莉任红梅
Owner BEIJING INST OF ENVIRONMENTAL FEATURES