Chip resistor detecting device

Abstract

The invention discloses an automatic, high-efficiency, and high-precision chip resistance detection device, which includes a high-precision industrial camera. A positive light source and a transparent positioning platform are sequentially arranged under the high-precision industrial camera. As for the backlight source, the wafer resistance detection device is also connected to an automatic control device, and the automatic control device is provided with an operation panel. This device adopts a high-precision industrial camera, and the entire chip resistance is photographed to complete the front and back defect detection at one time. This device has high efficiency, high precision, good reliability and high degree of automation in detecting chip resistance, and avoids eye fatigue of workers, and its function is also incomparable with manual work. Reasonably, the front light source and back light source are respectively installed above the chip resistance. And below, take pictures of the front and back of the chip resistor within 0.5 seconds.

Description

technical field [0001] The invention belongs to the field of detection devices, in particular to a chip resistance detection device. Background technique [0002] With the rapid development of the electronic market, electronic passive components such as chip resistors have been developed into high-quality and miniaturized components. Part of the defects of chip resistors can only be detected by the positive light source, and the other part needs to be detected by the back light. The traditional method is to use a microscope manually. The appearance and defects of chip resistors are inspected by naked eyes, but manual inspection has many disadvantages. For example, the human naked eye will be fatigued after a long time of inspection, resulting in unstable quality of chip resistors, low production efficiency, and insufficient accuracy of the appearance of the inspected; On the one hand, it causes product waste. For example, if a bad product in a chip resistor is used, it will ...

AI Technical Summary

Problems solved by technology

[0002] With the rapid development of the electronic market, electronic passive components such as chip resistors have been developed into high-quality and miniaturized components. Part of the defects of chip resistors can only be detected by the positive light source, and the other part needs to be detected by the back light. The traditional method is to use a microscope manually. The appearance and defects of chip resistors are inspected by naked eyes, but manual inspection has many disadvantages. For example, the human naked eye will be fatigued after a long time of inspection, resulting in unstable quality of chip resistors, low production efficiency, and insufficient accuracy of the appearance of the inspected; On the one hand, it causes product waste. For example, if a bad product in a chip resistor is used, it will be discarded together with the entire column of the chip resistor.

Product appearance and defect detection are very critical in the entire manufacturing process, and appearance defect detection cannot be guaranteed, which will directly affect the quality and function of the finished product

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