Reliability modeling method for related multi-mode system based on failure mechanism

A multi-state system and fault mechanism technology, applied in electrical digital data processing, special data processing applications, instruments, etc., can solve the problem that no scholar has proposed a fault mechanism unit or system multi-state characteristic reliability modeling method

Active Publication Date: 2017-03-15
BEIHANG UNIV
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Problems solved by technology

[0005] Through the search and novelty of existing technologies, no domestic scholars have proposed a reliability modeling method for failure mechanism correlation and multi-state characteristics of units or systems

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  • Reliability modeling method for related multi-mode system based on failure mechanism
  • Reliability modeling method for related multi-mode system based on failure mechanism
  • Reliability modeling method for related multi-mode system based on failure mechanism

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specific Embodiment

[0156] The following embodiments use the joint modeling method of improving the binary decision diagram and the multi-state multi-valued decision diagram to model the part of the circuit system in the multi-state optical system, and carry out Matlab simulation analysis to it, so as to embody the present invention Beneficial effect.

[0157] You can still refer to the attached image 3 As shown, the present invention is a multi-state system reliability modeling method based on fault mechanism correlation, and the specific implementation steps are as follows:

[0158] Step 1: Analyze the components of the system, and clearly define the various states of the system and its components. The system structure of the optical system is as attached Figure 16 shown. It mainly includes optical probe module and signal processing module, including 11 components in total. The name and description of each component are shown in Table 4.

[0159] Table 4 Detailed description of each comp...

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Abstract

The invention provides a reliability modeling method for a related multi-mode system based on a failure mechanism. The method comprises the following steps: analyzing system components and confirming and limiting various states of the system and the components; respectively confirming the failure mechanism of each component and the related relation of each failure mechanism under the working environments of the limited states and the function conditions, and establishing a binary decision graph model related to the failure mechanism for each component; calculating the state probability of each component according to the binary decision graph model established in the step (2) under the condition of the service life distribution of each known component under the independent effect of each failure mechanism and establishing a multi-mode multi-value decision graph model based on each component for the system according to the logic relation of each component in the system; substituting the state probability of each component acquired in the step (3) into the logic expressed by the multi-mode multi-value decision graph model established in the step (4) and calculating the state probability of the whole system and the system reliability.

Description

technical field [0001] The invention relates to the field of reliability modeling of multi-state systems, in particular to a multi-state system reliability modeling method based on failure mechanism correlation. Background technique [0002] The reliability model is a logic diagram representing the functional relationship between the units in the product. The logic diagram shows the logical relationship of how the failure of each unit or their combination leads to product failure. Reliability modeling is the premise of reliability work. Reliability distribution and prediction in the product scheme design stage, fault analysis and reliability evaluation in the manufacturing stage all require the establishment of reliability models. Reliability models include reliability block diagrams, fault trees, Petri nets, Bayesian nets, etc. Current research has extended these basic reliability models to dynamic and discrete fields. As a reliability modeling tool, binary decision diagr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCG06F30/20
Inventor 陈颖李颖异康锐
Owner BEIHANG UNIV
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