A Method and Device for Abnormal Correction of Micro-resistivity Scanning Imaging Logging Data
A technology for logging data and scanning imaging, which is used in measurement devices, radio wave measurement systems, and electrical/magnetic detection for logging records. Level changes, etc.
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example 1
[0111] Example 1: Correct the abnormally large data of the pole plate or electric buckle.
[0112] Such as image 3 The original data and imaging display of the STAR-II microresistivity scanning imaging of Well X1, through the abnormal detection of the original data, the detection results show that the value of the whole well section of the No. 5 plate is too large, and the No. 3 plate and the No. The value of the segment is too large (see the original plate data in the first track), and the processed static and dynamic images have obvious dark bands and linear stripes (the second and third tracks). Applying the correction method of the present invention can correct the abnormal type detected, and the corrected plate data and imaging results are as follows: Figure 4 shown.
example 2
[0113] Example 2: Processing of negative outliers in well logging data.
[0114] Figure 5 The original plate data curves were scanned and imaged for the FMI microresistance of well X2. It can be seen that there are a large number of negative values (FCC1 and FCC2) on the main board on the No. 3 arm, but the change trend of each button curve is consistent with that of other plates. It belongs to the situation that the plate data is completely invalid, and this kind of data can still be used after certain correction processing.
[0115] Before correction, if the negative number is replaced by a very small value close to 0, a large number of white blocks will appear in the image, which is obviously inappropriate; if the negative number is not handled abnormally, the color scale range corresponding to the valid data will be reduced, and the resolution of the static image will be reduced. reduce (such as Figure 7 The first static image), dynamic images appear white spots or w...
example 3
[0116] Example 3: Verification of Correction for Excessive Differences in Formation Characteristic
[0117] Figure 8 The original plate data and images of XRMI micro-resistivity scanning imaging for Well X3 show that the lithology of the formation in the measured section of the well has changed greatly, and the upper part is a sandy mudstone formation, and the recorded plate value ranges from 0 to 1000 (such as Figure 8 The first and second traces), the lower part is the tuff formation, and the range of plate values recorded is 0-1000 (such as Figure 8 4th and 5th track), although this kind of data is a true reflection of the formation, it cannot scale and describe the static image very well, which affects the effect of longitudinal mapping, such as Figure 8 In the third track, in order to better scale and display the static image of the upper stratum, all the lower images are brightened. In the sixth track, in order to show the static image of the lower stratum, the scale ...
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