A thermistor temperature acquisition circuit and its self-inspection method

Abstract

The invention discloses a temperature acquisition circuit of a thermistor and a self-checking method of the temperature acquisition circuit. The acquisition circuit comprises an MCU, a voltage dividing branch, a self-checking branch and a sampling filter capacitor. After the MCU controls the self-checking branch to be conducted, the acquisition circuit begins to execute a self-checking function; and when the condition that a difference value between actual sampling voltage and theoretical sampling voltage output by the voltage dividing branch is not in a preset difference value range is determined, a failure of the acquisition circuit is judged. Compared with a traditional acquisition circuit, the self-checking function is added to the acquisition circuit disclosed by the invention, and the failure of a sampling circuit can be timely found out through self-checking of the acquisition circuit, so that a technician can timely take effective measures, and the sampling error caused by the failure of the sampling circuit is avoided.

Description

technical field [0001] The invention relates to the technical field of temperature acquisition, and more specifically relates to a thermistor temperature acquisition circuit and a self-inspection method thereof. Background technique [0002] A thermistor is a device that converts temperature changes into resistance changes. At present, the thermistor temperature acquisition circuit is mainly used to sample the temperature value detected by the thermistor. The working principle of the thermistor temperature acquisition circuit is as follows: first convert the resistance value change of the thermistor into a voltage change, and then convert the voltage change from an analog signal to a digital signal through the processing chip, and then convert the voltage change in the form of a digital signal The variation is processed to obtain the temperature value detected by the thermistor. [0003] It can be seen that the working reliability of the thermistor temperature acquisition ...

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Problems solved by technology

[0004] In view of this, the present invention discloses a thermistor temperature acquisition circuit and its self-inspection method to solve the sampling error problem caused by the failure of the traditional thermistor temperature acquisition circuit

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