Electromagnetic acceleration enhanced plasma detection system

Abstract

The invention discloses an electromagnetic acceleration enhanced plasma detection system which combines electromagnetic acceleration with a laser plasma excitation detection technique. The electromagnetic acceleration enhanced plasma detection system provided by the invention is a system capable of completing material element and component content detection. The detection system mainly comprises a light source module, an electromagnetic acceleration module, a sample module, a control module, a probing module, a logic module and a display module; the logic module is connected with the control module, the probing module and the display module; the control module realizes the control on the light source module, the electromagnetic acceleration module and the probing module; light emitted from the light source module irradiates a to-be-detected object on the sample module and induces plasma, the plasma enters the probing module under the action of the electromagnetic acceleration module, and the detection collects sample module information and transfers the sample module information to the logic module. The electromagnetic acceleration enhanced plasma detection system provided by the invention has better probing precision and lower detection limit, and realizes zero pretreatment on a to-be-detected sample.

Description

technical field [0001] The invention belongs to a detection system, in particular to a detection system which realizes enhanced plasma detection through electromagnetic acceleration. Background technique [0002] Plasma detection, which is a kind of spectral detection technology that has gradually emerged in recent years by measuring the induced plasma spectrum on the surface of a substance, is a kind of atomic emission spectroscopy. Plasma technology is so far the only known technique capable of detecting spectra of all elements in any environment; also in various sample forms in solid, liquid, powder, gas form. At the same time, the plasma detection technology has many advantages such as fast measurement speed, remote non-contact measurement, and simple system structure. Based on the many advantages and versatility of plasma detection technology, some people call it a "universal" detection technology. [0003] At the same time, it cannot analyze multiple elements at the ...

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Problems solved by technology

[0004] However, there are certain problems in traditional plasma detection, for example, the detection limit is not low enough, resulting in the minimum detection limit of many e

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