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A Thyristor Series Pairing Test Circuit and Method

A technology for testing circuits and testing methods, which is applied in the direction of single semiconductor device testing, etc., to achieve strong adaptability

Active Publication Date: 2019-09-10
ZHUZHOU CRRC TIMES SEMICON CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0013] In view of this, the object of the present invention is to provide a thyristor series pairing test circuit and method, which can solve the technical problems of fast thyristor practical application condition simulation and improve the accuracy of fast thyristor matching

Method used

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  • A Thyristor Series Pairing Test Circuit and Method
  • A Thyristor Series Pairing Test Circuit and Method
  • A Thyristor Series Pairing Test Circuit and Method

Examples

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Embodiment 1

[0067] As attached image 3 As shown, a specific embodiment of a thyristor series matching test circuit includes: a main circuit, a first shut-off branch and a second shut-off branch connected in parallel with each other.

[0068] The main circuit includes: the first switch K1 (main circuit switch) connected in series, one DUT of the tested thyristor, two DUT3 of the tested thyristor, the third capacitor E3 (forward capacitor) and a freewheeling circuit. The freewheeling circuit further includes a parallel connection with each other. The freewheeling branch D1 and the third inductor L3 (main loop inductance).

[0069] The first turn-off branch includes: a second capacitor E2, a second switch K2, and a second inductor L2 connected in series with each other.

[0070] The second turn-off branch includes: a first capacitor E1, a third switch K3, and a first inductor L1 connected in series with each other.

[0071] The first capacitor E1 and the second capacitor E2 are shutdown capacitors ...

Embodiment 2

[0082] A specific embodiment of the thyristor series matching test method based on the above circuit includes the following steps:

[0083] When the third capacitor E3 is charged, the first switch K1 is turned on, and the second DUT3 of the tested thyristor and the first DUT of the tested thyristor are turned on. After the set initial pulse width time T1, the second switch K2 is turned on, and the second switch K2 is turned off. Test thyristor two DUT3, tested thyristor one DUT, after the set off time T2, turn on the tested thyristor two DUT3, tested thyristor one DUT again, after the set pulse width time T3, turn on the third switch K3, turn off the second DUT3 of the tested thyristor and the first DUT of the tested thyristor, and a test cycle ends. In a test cycle, turn off the second DUT3 of the tested thyristor for the first time, and complete the low current voltage equalization test for the first DUT of the tested thyristor, and turn off the second DUT3 of the tested thyris...

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Abstract

The invention discloses a test circuit and method for conducting series and pairing of thyristors. The method includes the following steps: if a third capacitor is charged, turning on a first switch, triggering a to-be-tested thyristor 2 and a to-be-tested thyristor 1 to be communicated, after a set initial pulse width time, turning on a second switch, turning off the to-be-tested thyristor 2 and the to-be-tested thyristor 1, again communicating the to-be-tested thyristor 2 and the to-be-tested thyristor 1 after a set turning off time, after a set pulse width period, turning on the third switch, turning off the to-be-tested thyristor 2 and the to-be-tested thyristor 1, thus completing the first test period. Within one test period, the to-be-tested thyristor 2 and the to-be-tested thyristor 1 are turned off for the first time so as to complete small current voltage sharing tests, the to-be-tested thyristor 2 and the to-be-tested thyristor 1 are turned off for the second time, and the afterflow effects of an afterflow circuit is used to complete heavy current voltage sharing tests. According to the invention, the method herein can simulate actual application and working condition of thyristors in a fast manner and increase the accuracy of conducting series and pairing of thyristors in a fast manner.

Description

Technical field [0001] The present invention relates to the field of circuit testing, in particular to a testing circuit and method applied to the serial pairing of fast thyristors. Background technique [0002] Fast thyristors often use multiple series connection methods in practical applications, so the fast thyristors need to be tested in series during the test. In the prior art, the conventional fast thyristor series pairing method is to perform standard tests on the fast thyristors for turn-off time (Tq) and recovery charge (Qrr) one by one, and then perform the turn-off time Tq and recovery charge Qrr parameters of the thyristors close to each other. Tandem pairing. However, due to the complicated actual application conditions of fast thyristors, the accuracy of conventional matching methods is not high, and fast thyristors can only be tested under typical standard conditions during manufacturing and testing. This standard test condition is very different from the actual a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26
Inventor 彭军华邹平高超刘栋贺振卿窦金龙王真朱斌银登杰
Owner ZHUZHOU CRRC TIMES SEMICON CO LTD
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