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Test circuit and method for conducting series and pairing of thyristors

A technology for testing circuits and testing methods, applied in the direction of single semiconductor device testing, etc., to achieve strong adaptability

Active Publication Date: 2017-07-25
ZHUZHOU CRRC TIMES SEMICON CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0013] In view of this, the object of the present invention is to provide a thyristor series pairing test circuit and method, which can solve the technical problems of fast thyristor practical application condition simulation and improve the accuracy of fast thyristor matching

Method used

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  • Test circuit and method for conducting series and pairing of thyristors
  • Test circuit and method for conducting series and pairing of thyristors
  • Test circuit and method for conducting series and pairing of thyristors

Examples

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Embodiment 1

[0067] as attached image 3 As shown, a specific embodiment of a thyristor series pair test circuit includes: a main circuit connected in parallel, a first turn-off branch and a second turn-off branch.

[0068] The main circuit includes: the first switch K1 (main circuit switch) connected in series with each other, the first thyristor under test DUT, the second thyristor under test DUT3, the third capacitor E3 (forward capacitor) and the freewheeling circuit, and the freewheeling circuit further includes mutual parallel The freewheeling branch D1 and the third inductance L3 (main loop inductance).

[0069] The first turn-off branch includes: a second capacitor E2, a second switch K2 and a second inductor L2 connected in series.

[0070] The second turn-off branch includes: a first capacitor E1 , a third switch K3 and a first inductor L1 connected in series.

[0071] The first capacitor E1 and the second capacitor E2 are turn-off capacitors E1 and E2, the second switch K2 and...

Embodiment 2

[0082] A specific embodiment of a thyristor series pairing test method based on the above circuit, comprising the following steps:

[0083]When the third capacitor E3 is charged, the first switch K1 is turned on, and the second thyristor DUT3 and the first thyristor DUT under test are triggered to be turned on. After the set initial pulse width time T1, the second switch K2 is turned on, and the second switch K2 is turned off. The second thyristor DUT3 under test and the first thyristor DUT under test are turned on again after the set off time T2. After the set pulse width time T3, the third switch is turned on. K3, turn off the second thyristor DUT3 under test and the first DUT thyristor under test, and a test period ends. In a test cycle, turn off the second thyristor DUT3 and the first thyristor DUT under test for the first time to complete the small current voltage equalization test, turn off the second thyristor DUT3 under test and the first thyristor DUT under test, and ...

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Abstract

The invention discloses a test circuit and method for conducting series and pairing of thyristors. The method includes the following steps: if a third capacitor is charged, turning on a first switch, triggering a to-be-tested thyristor 2 and a to-be-tested thyristor 1 to be communicated, after a set initial pulse width time, turning on a second switch, turning off the to-be-tested thyristor 2 and the to-be-tested thyristor 1, again communicating the to-be-tested thyristor 2 and the to-be-tested thyristor 1 after a set turning off time, after a set pulse width period, turning on the third switch, turning off the to-be-tested thyristor 2 and the to-be-tested thyristor 1, thus completing the first test period. Within one test period, the to-be-tested thyristor 2 and the to-be-tested thyristor 1 are turned off for the first time so as to complete small current voltage sharing tests, the to-be-tested thyristor 2 and the to-be-tested thyristor 1 are turned off for the second time, and the afterflow effects of an afterflow circuit is used to complete heavy current voltage sharing tests. According to the invention, the method herein can simulate actual application and working condition of thyristors in a fast manner and increase the accuracy of conducting series and pairing of thyristors in a fast manner.

Description

technical field [0001] The invention relates to the field of circuit testing, in particular to a testing circuit and method for fast thyristor series pairing. Background technique [0002] Fast thyristors are often used in series in practical applications, so fast thyristors need to be tested in series during the test. In the prior art, the conventional fast thyristor series pairing method is to conduct the standard test of the turn-off time (Tq) and recovery charge (Qrr) of the fast thyristors one by one, and then test the thyristors whose parameters are close to the turn-off time Tq and recovery charge Qrr. paired in series. However, due to the complex actual application conditions of fast thyristors, the accuracy of conventional matching methods is not high, and fast thyristors can only be tested according to typical standard conditions during manufacturing tests, which are very different from actual application conditions. Although Selecting thyristors with consistent ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
Inventor 彭军华邹平高超刘栋贺振卿窦金龙王真朱斌银登杰
Owner ZHUZHOU CRRC TIMES SEMICON CO LTD
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