Static testing null pointer reference defect false-positive recognition method

A technology for static testing and identification methods, applied in software testing/debugging, error detection/correction, instrumentation, etc., and can solve problems such as many constraints

Active Publication Date: 2017-07-28
XIAN UNIV OF POSTS & TELECOMM
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Existing static test optimization methods optimize the detected Null Pointer Dereference (NPD) defects based on automated static test tools. Collect releva...

Method used

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  • Static testing null pointer reference defect false-positive recognition method
  • Static testing null pointer reference defect false-positive recognition method
  • Static testing null pointer reference defect false-positive recognition method

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Embodiment Construction

[0025] Taking a certain NPD defect detected by program P during static testing as an example, combined with figure 1 The embodiment of the static test NPD defect false positive identification method of the present invention is described in detail.

[0026] (1) A static test defect report S in .xml format generated after static testing using a static testing tool for program P R , S R It is a structured data storage file composed of different levels of elements, all elements have text content and attributes, all elements have sub-elements, and the contents related to defects are included in the elements, S R The data is described using a series of tags, with opening and closing tags defining elements in S R Describe the scope of the content of the defect in figure 2 When the program P where the code segment is located is executed to L1, an NPD defect is triggered as image 3 is the static test defect report S generated for the program P R organizational structure, in th...

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Abstract

The invention provides a static testing null pointer reference defect false-positive recognition method. According to the software static testing null pointer reference defect false-positive problem, a static testing defect report of to-be-tested software and null pointer reference defect knowledge in a software historical warehouse are extracted; null pointer reference defect initiating conditions are extracted in a null pointer reference defect mode and compared with the null pointer reference defect knowledge, so that a null pointer reference defect associate attribute group is determined, and null pointer reference defect data sets are constructed; the null pointer reference defect data sets are classified through the ID3 algorithm based on the rough set theory attribute importance, classification results are used for null pointer reference defect false-positive recognition, and true null pointer reference defects are confirmed. The method is combined with the null pointer reference defect knowledge and the ID3 algorithm based on the rough set theory attribute importance for static testing null pointer reference defect false-positive recognition, the detection efficiency and stability of the static testing null pointer reference defects are improved, and the null pointer reference defect confirmation cost is reduced.

Description

technical field [0001] The invention belongs to the technical field of software testing, especially in the technical field of static testing, and is used for identifying false positives of null pointer reference defects in static testing, reducing the cost of confirming null pointer reference defects, and improving the detection efficiency and stability of static testing null pointer reference defects , is an optimization method for statically testing null pointer reference defects. Background technique [0002] Software testing is a process of ensuring software quality, which aims to find software defects as early as possible and reduce testing costs. In the process of static testing, the tester checks the grammar, structure, process, interface, etc. of the source program without running the program to find out the structural anomalies and data flow anomalies in the program that may cause defects. Existing research on static testing is usually divided into two categories: ...

Claims

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Application Information

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IPC IPC(8): G06F11/36
CPCG06F11/3688G06F11/3692
Inventor 王曙燕孙家泽权雅菲
Owner XIAN UNIV OF POSTS & TELECOMM
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