Teaching difficult point big-data analysis system

Abstract

The invention relates to the field of electronics, in particular to analysis systems. A teaching difficult point big-data analysis system includes an examination paper reviewing system, a knowledge point classifying system and a teaching difficult point statistical system; the examination paper reviewing system is used for reviewing students' examination papers and extracting mark numbers of examination questions which are wrongly answered in each student's examination paper, and the extracted mark numbers serve as mistake question mark numbers; statistical operation is conducted on the examination papers of all students, and the error rate of each mistake mark number is extracted; the knowledge point classifying system is provided with an examination-question-classifying category list, and mark numbers of examination questions based on the same knowledge point are classified into a knowledge point item in the examination-question-classifying category list; the teaching difficult point statistical system is used for adding up the error rate of each examination question mark number in one knowledge point item, and the overall error rate of the knowledge point item is obtained; the knowledge point items of which the overall error rates are 50% or above serve as teaching difficult points. According to the teaching difficult point big-data analysis system, the teaching difficult points are found out through teaching difficult point big-data analysis, so that it is convenient for teachers to learn about the teaching difficult points, and therefore the teachers can further explain the teaching difficult points to the students.

Description

technical field [0001] The invention relates to the field of electronics, in particular to an analysis system. Background technique [0002] Existing schools use the test paper review system to review test papers, but after reviewing test papers, teachers can only know the overall mastery of the course for most students through the test papers, but they cannot intuitively know the mastery of a certain knowledge point. It cannot directly analyze the knowledge points that students generally cannot answer correctly in the examination papers and examination questions, that is, the teaching difficulties; [0003] Although the teacher can artificially count the knowledge points that students generally fail to answer correctly in the test papers, the workload is too heavy and it is not easy to implement. Contents of the invention [0004] The purpose of the present invention is to provide a big data analysis system for teaching difficulties to solve the above technical problems....

AI Technical Summary

Problems solved by technology

[0002] Existing schools use the test paper review system to review test papers, but after reviewing test papers, teachers can only know the overall mastery of the course for most students through the test papers, but they cannot intuitively know the mastery of a certain knowledge point. It cannot directly analyze the knowledge points that students generally cannot answer correctly in the examination papers and examination questions, that is, the teaching difficulties;

[0003] Although the teacher can artificially count the knowledge points that students generally fail to answer correctly in the test papers, the workload is too heavy and it is not easy to implement

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