Long-range correlation degradation process remaining life prediction method depending on time and states
A life prediction and state technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve problems such as difficult parameter estimation, inability to write out likelihood functions, difficulty in obtaining first-arrival time distribution, etc., to achieve estimation The results are accurate
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[0045] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:
[0046] A method for predicting the remaining life of a long-range correlation degradation process dependent on time and state proposed by the present invention, the process is as follows figure 1 Shown:
[0047] Step 1: Sampling time t at equal intervals respectively 0 ,t 1 ,t 2 ,...,t k , collect device sensor data x 0 ,x 1 ,x 2 ,...,x k , where k is the number of samples;
[0048] Step 2: Establish a degradation model based on fractal Brownian motion according to the collected device sensor data characteristics, as shown in formula (1):
[0049] dX(t)=μ[X(t),t; θ]dt+σ H dB H (t)(1);
[0050] Among them, X(t) is the degradation process, μ[X(t),t;θ] is the coefficient of the drift term, θ is a vector composed of unknown parameters contained in the coefficient of the drift term, σ H is the coefficient of the diffusion term, B H (t) ...
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