Unlock instant, AI-driven research and patent intelligence for your innovation.

A shelf for storing defective products in warehouse for integrated circuit testing

A technology for integrated circuits and storage racks, which is applied in the field of storage racks and can solve problems such as littering of bad integrated circuits and difficulty in recycling bad integrated circuits

Active Publication Date: 2019-06-28
江苏农航机械设备有限公司
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In order to overcome the disadvantages that the placement rack in the prior art cannot effectively classify and place defective integrated circuits, resulting in the littering of defective integrated circuits and causing serious difficulties in the recycling of defective integrated circuits, the present invention The technical problem to be solved by the invention is to provide an integrated circuit testing warehouse defective product placement rack that can effectively classify and place defective integrated circuit products

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A shelf for storing defective products in warehouse for integrated circuit testing
  • A shelf for storing defective products in warehouse for integrated circuit testing
  • A shelf for storing defective products in warehouse for integrated circuit testing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0036] A warehouse defective product placement rack for integrated circuit testing, such as Figure 1-7 As shown, it includes a placement frame 1, a placement mechanism 2 and a warning mechanism 3, the placement mechanism 2 is connected in the placement frame 1, and the warning mechanism 3 is connected to the left end of the placement frame 1.

Embodiment 2

[0038] A warehouse defective product placement rack for integrated circuit testing, such as Figure 1-7 As shown, it includes a placement frame 1, a placement mechanism 2 and a warning mechanism 3, the placement mechanism 2 is connected in the placement frame 1, and the warning mechanism 3 is connected to the left end of the placement frame 1.

[0039] The placing mechanism 2 includes a first sliding rail 201, a first sliding block 202, a clamping block 203, a connecting rod 205 and a first partition 206, and the upper and lower walls of the placing frame 1 are symmetrically connected with the first sliding rail 201 up and down. , the first slide rails 201 on the upper and lower sides of the upper wall and the lower wall are slidably connected with the first slider 202 evenly, and the first sliders 202 cooperate with the first slide rails 201 on the upper and lower sides of the upper wall and the lower wall, The number of the first sliders 202 on the first slide rail 201 is fo...

Embodiment 3

[0041] A warehouse defective product placement rack for integrated circuit testing, such as Figure 1-7 As shown, it includes a placement frame 1, a placement mechanism 2 and a warning mechanism 3, the placement mechanism 2 is connected in the placement frame 1, and the warning mechanism 3 is connected to the left end of the placement frame 1.

[0042] The placing mechanism 2 includes a first sliding rail 201, a first sliding block 202, a clamping block 203, a connecting rod 205 and a first partition 206, and the upper and lower walls of the placing frame 1 are symmetrically connected with the first sliding rail 201 up and down. , the first slide rails 201 on the upper and lower sides of the upper wall and the lower wall are slidably connected with the first slider 202 evenly, and the first sliders 202 cooperate with the first slide rails 201 on the upper and lower sides of the upper wall and the lower wall, The number of the first sliders 202 on the first slide rail 201 is fo...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a placement rack, in particular to a warehouse defective product placement rack for integrated circuit testing. The warehouse defective product placement rack for integrated circuit testing has the advantage that defective integrated circuit products can be effectively classified and placed. The warehouse defective product placement rack for integrated circuit testing comprises a placement rack body and the like; a placement mechanism is connected in the placement rack body; and a warning mechanism is connected to the left end of the placement rack body. According to the placement rack, the effects of effectively classifying and placing the defective integrated circuit products can be achieved.

Description

technical field [0001] The invention relates to a placement rack, in particular to a warehouse defective product placement rack for integrated circuit testing. Background technique [0002] An integrated circuit is a tiny electronic device or component. Using a certain process, the transistors, resistors, capacitors, inductors and other components required in a circuit are interconnected, and they are fabricated on a small or several small semiconductor wafers or dielectric substrates, and then packaged in a tube. , and become a microstructure with required circuit functions; all the components in it have been structurally integrated, making electronic components a big step towards miniaturization, low power consumption, intelligence and high reliability. It is represented by the letter "IC" in the circuit. The inventors of the integrated circuit are Jack Kilby (germanium (Ge)-based integrated circuits) and Robert Noyce (silicon (Si)-based integrated circuits). Most of to...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): B65G1/02B65G1/20
CPCB65G1/02B65G1/20
Inventor 杜俊慧陈耿佳袁婷
Owner 江苏农航机械设备有限公司