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Mura defect detection method for AMOLED display screen

A defect detection and display technology, applied in image analysis, image enhancement, instruments, etc., can solve the problems of uneven display area, uneven brightness display of screen area, unclear edge outline, etc. average image effect

Active Publication Date: 2018-02-16
HARBIN INST OF TECH SHENZHEN GRADUATE SCHOOL
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Problems solved by technology

Because there are various defects in the manufacturing process of AMOLED display screens, such as point defects, line defects, and Mura defects (the name of Mura comes from a Japanese word, specifically referring to panel defects, which is used to represent when the display is displayed at a constant brightness. , the unevenness of the display area) will have an impact on the uniformity of light emission, image clarity, and life of the AMOLED display.
[0003] Mura defect is a bad defect that seriously affects the picture quality of AMOLED display, mainly manifested as uneven brightness display in the screen area
There are many types and shapes of mura defects, and the contrast is low, the position is not fixed, and the edge outline is not clear. Compared with other optical defects of the display, mura defects are more difficult to detect
The traditional human eye detection method mainly relies on the experience and subjective feelings of the inspector to detect mura defects and evaluate their grades, which may lead to inconsistent judgment results of different inspectors for the same mura defect

Method used

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  • Mura defect detection method for AMOLED display screen
  • Mura defect detection method for AMOLED display screen
  • Mura defect detection method for AMOLED display screen

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Embodiment Construction

[0015] The present invention will be further described below in conjunction with the description of the drawings and specific embodiments.

[0016] Such as Figure 1 to Figure 4 Shown, a kind of AMOLED display screen Mura defect detection method comprises:

[0017] 1. Use the mean shift algorithm to pre-segment the Mura image of the AMOLED display;

[0018] 2. Using the improved level set algorithm to segment the Mura image of AMOLED display screen.

[0019] The first unit, the mean shift algorithm, has an iterative process. First calculate the mean shift value of the current point, then move the point to the mean shift value, and then use this as a new starting point to continue moving until certain conditions are met. Its derivation process is as follows:

[0020] Assuming a d-dimensional space R d There are n sample points, use x i Indicates the attribute value of each sample point, where i=1,2,...,n. in R d Choose a sample point x in , and the mean shift vector of p...

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Abstract

The invention provides a Mura defect detection method for an AMOLED display screen. The method comprises the steps of firstly performing pre-segmentation on a Mura image of the AMOLED display screen by adopting a mean shift algorithm to obtain an initial profile required by a level set algorithm; and secondly performing segmentation on the Mura image of the AMOLED display screen by adopting the level set algorithm combining local and global information of the image. The method has the beneficial effects that the problem that a local image model is sensitive to the initial profile is solved; the proposed level set algorithm combines the local and global information of the image; and the problem that a global image model cannot process the image with grayscale unevenness is solved.

Description

technical field [0001] The invention relates to a method for detecting a display screen, in particular to a method for detecting a Mura defect of an AMOLED display screen. Background technique [0002] Active Matrix Organic Light Emitting Diode Panel (AMOLED) is regarded as the next generation display technology, which has the characteristics of fast response, high contrast, wide viewing angle and low energy consumption. Because there are various defects in the manufacturing process of AMOLED display screens, such as point defects, line defects, and Mura defects (the name of Mura comes from a Japanese word, specifically referring to panel defects, which is used to represent when the display is displayed at a constant brightness. , the non-uniformity of the display area) will have an impact on the uniformity of light emission, image clarity, and life of the AMOLED display. [0003] Mura defect is a bad defect that seriously affects the picture quality of AMOLED display, main...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/13G06T7/143G06T7/12G06T7/149
CPCG06T7/0004G06T2207/20076G06T2207/20116G06T2207/30108G06T7/12G06T7/13G06T7/143G06T7/149
Inventor 肖君军李雄杰姚杏枝
Owner HARBIN INST OF TECH SHENZHEN GRADUATE SCHOOL
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