397 results about "Line defects" patented technology

The present invention provides an optical switch having a photonic crystal structure.

An optical switch of the invention has a slab optical waveguide structure whose core (35) has a two-dimensional photonic crystal structure where two or more media (33, 34) with different refractive indices are alternately and regularly arranged in a two-dimensional manner. The photonic crystal structure comprises: a line-defect waveguide; and means for altering the refractive index of the line-defect waveguide.

To prevent a point defect and a line defect in forming a light-emitting device, thereby improving the yield. A light-emitting element and a driver circuit of the light-emitting element, which are provided over different substrates, are electrically connected. That is, a light-emitting element and a driver circuit of the light-emitting element are formed over different substrates first, and then electrically connected. By providing a light-emitting element and a driver circuit of the light-emitting element over different substrates, the step of forming the light-emitting element and the step of forming the driver circuit of the light-emitting element can be performed separately. Therefore, degrees of freedom of each step can be increased, and the process can be flexibly changed. Further, steps (irregularities) on the surface for forming the light-emitting element can be reduced than in the conventional technique.

A semiconductor memory device that efficiently replaces defective word lines by redundancy word lines. The semiconductor memory device includes a plurality of banks, each bank having a plurality of normal word lines and a plurality of redundancy word lines. A defective word line can be replaced by the redundancy word lines when defects occur in the normal word lines. When word line defects occur, redundancy word lines banks adjacent to the bank having the defective work line may be used.

The invention discloses an LCD general defect detecting method. The LCD general defect detecting method comprises the following steps of (1) carrying out preprocessing on images, (2) separating defects of images of a black and white mode, (3) determining point defects and line defects, (4) zooming grey mode images, (5) reestablishing images, (6) detecting point-shaped foreign body defects, (7) detecting area-shaped foreign body defects, and (8) detecting line-shaped foreign body detects. The LCD general defect detecting method carries out Gaussian smoothing on the images to remove noise, gradient values are then solved, edge points are determined preliminarily according to the gradient values, the edge position is finally located precisely in detail, and effects are made to be clearer.

High-speed interconnect systems for connecting two or more electrical elements are provided. Interconnect system has the means, which could reduce the microwave loss induced due to the dielectrics. Reducing the effective loss tangent of the dielectrics reduces the microwave loss. With optimize design of the interconnects, the speed of the electrical signal can be made to closer to the speed of the light. The interconnect systems consists of the electrical signal line, inhomogeneous dielectric systems and the ground line, wherein inhomogeneous dielectric system consisting of the opened-trenches into the dielectric substrate or comb-shaped dielectrics to reduce the microwave loss. Alternatively dielectric structure can have the structure based on the fully electronic or electromagnetic crystal or quasi crystal with the line defect. Alternatively, dielectric structure can be made to comb-shaped structure with teethes having thickness and space making the air pocket to reduce the microwave loss. The interconnect system, can be made in rigid or flex board for off-chip interconnects for IC packages, connectors and cables, where conventional manufacturing technology can be used and yet to increase the bandwidth of the interconnects.

The invention provides an unmanned plane patrol method and system. The method comprises steps that a data acquisition step, the data is acquired; a facial area generation step, a facial area object is generated; a task sub area planing step, the DEM data is processed through GIS buffer area analysis to generate the facial area object, and the facial area object is divided into multiple sub areas according to a height difference threshold of an unmanned plane; a course data generation step, the preliminary course data is sequentially connected to generate the course data; a patrol data acquisition step, the unmanned plane flies along a line determined by the course data and acquires the patrol data, and the patrol data comprises the original image data and the POS data; and an automatic line defect analysis step, a power line dangerous point interpretation result is automatically generated. Through the method, automatic patrol of the unmanned plane is realized through automatic task area patrol planning and automatic line defect analysis of the unmanned plane.

A method for testing line defects of an LCD panel, an array substrate and drive wires. The LCD panel comprises a plurality of groups of drive wires and a plurality of detection terminals, and each group of the drive wires at least comprises two drive wires, wherein the LCD panel further comprises a plurality of first switches, a plurality of second switches, a first switch control wire used for controlling the plurality of first switches, and a second switch control wire used for controlling the plurality of second switches, and one end of each of the two drive wires of at least one group of the drive wires is connected with one detection terminal through one first switch and one second switch respectively. At least two drive wires share one first detection terminal, so that the using times of probes can be reduced; the distance among the detection terminals are enlarged, and the defect of detection error caused by short circuit of the adjacent probes as soon as the probes are slightly bent can be avoided.

An organic light emitting diode (OLED) display module is provided wherein the aperture ratio of the respective pixels thereof improves and such display faults as line defect is prevented so as to allow image to be displayed with high quality. The display module is provided with a capacitor, a first terminal of which is connected to an output terminal of the first transistor as selected by the scanning line and a second terminal of which is connected to the gate placed anterior thereto, wherein the electric current is supplied to an organic emitting device in response to the data signal as supplied from the data line through the second transistor, which turns into on-state condition when the first transistor is put into an off-state condition, and as stored in the capacitor.

The invention discloses a power line defect diagnosis method based on a visible light image. The power line defect diagnosis method includes: a defect data gallery of a power line defect is established; an image from the defect data gallery is segmented, image features are extracted from the segmented image, a defect feature gallery is established based on the extracted image features, and the defect feature gallery serves as a reference benchmark of establishing recognition and classification of the power line defect; the visible light image is applied to capture an actual power line so as to obtain a captured image of the actual power line, and the image features of the captured image is extracted; the obtained image features of the actual power line image and the image features in the established defect feature gallery carry out matching; if a matched dot pair is greater than or equal to a preset threshold, the obtained image features of the actual power line image and the image features in the established defect feature gallery are matched, namely the actual power line has defects; and if the matched dot pair is smaller than the preset threshold, the obtained image features of the actual power line image and the image features in the established defect feature gallery are not matched, namely the actual power line is normal. The diagnosis method is efficient, and can automatically detect defects of the power line.

The invention relates to the technical field of image detection, and especially relates to a TFT-LCD lighting automatic optical inspection based image processing method. The image processing method comprises the following steps: acquiring images of a display screen in different modes; preprocessing the acquired images to remove the background interference; carrying out mask treatment on the preprocessed images; and carrying out defect extraction and calculation. The TFT-LCD lighting automatic optical inspection based image processing method uses a plurality of automatic optical inspection modes, can realize the normal detection of spot, line and Mura defects, and can realize the accurate positioning of light spot and light line defects to a sub-pixel, and the classification of the Mura defects according to an SEMU criterion. The image processing method has the advantages of simple flow, and effective ensure of the detection rate.

A TFT array substrate for use in LCD device includes at least one repair line to repair the line defects. The repair line(s) is formed when forming the pixel electrode so that additional process steps are not required. Accordingly, the productivity can increase. Moreover, either the short-circuit or the open-circuit can be repaired due to the the repair line(s). Thus, in the present invention, a TFT array substrate, including: a substrate; a gate line formed on the substrate, arranged in a transverse direction and having a gate electrode; a data line insulated against the gate line by a first insulation layer, arranged in a longitudinal direction perpendicular to the gate line, having a source electrode near the cross point of the gate and data lines, and having first and second data lines which are defined by a cross point of the gate and data lines; a drain electrode space apart from the source electrode over the gate electrode; a pixel electrode connecting to the drain electrode; and a repair line(s) insulated against the data and gate lines by insulation layers and overlapping the gate and data lines, the repair line(s) overlapping a free end of the other repair line and the gate line.

The invention discloses a simple electroless welding pen, which comprises a cartridge, welding flux and a lead. The welding flux is thermite; the simple electroless welding pen comprises the raw material constituents by weight percent: 60-70% of CuO (cupric oxide) powder, 15-20% of Al (aluminum) powder, 2-4% of KClO3 (potassium chlorate), 1-2% of KNO3 (potassium nitrate)+S (sulfur)+C (carbon) mixed powder, 4-6% of CaF2 (calcium fluoride) powder, 4-6% of CaSO4 (calcium sulfate) powder, 1-2% of Fe (Ferrum) powder and 1-2% of Mn (manganese) powder; and the mixed powder is KNO3, S and C freely mixed. According to the method disclosed by the invention, the problems of inexhaustive slag separation and more welding line defects in the welding lines in the prior art are solved without any welding device and power supply. The preparation method has the advantages of simple preparation process and simple, fast and safe welding operation, and is particularly suitable for field emergency operation.

A radio-frequency photonic devices employs photon-phonon coupling for information transfer. The device includes a membrane in which a two-dimensionally periodic phononic crystal (PnC) structure is patterned. The device also includes at least a first optical waveguide embedded in the membrane. At least a first line-defect region interrupts the PnC structure. The first optical waveguide is embedded within the line-defect region.

The invention relates to a power transmission line defect detection method and system and electronic equipment. The method comprises the steps of constructing a power transmission line defect detection model based on virtual and real sample integration and transfer learning according to image sample data of power transmission line elements, The method specifically comprises the following steps: step a, constructing a virtual and real integrated virtual sample generation and labeling model, integrating rich ground object information in virtual data and real image data, and fusing the virtual data and the real data; B, constructing a deep learning transfer learning model, and completing model optimization based on transfer learning; And step c, training a deep learning model based on a target detection algorithm, and carrying out abnormity diagnosis on the power transmission line element on the basis of target detection of deep learning. Through deep learning distributed training of massimage samples, the power transmission line defect detection model based on multi-image fusion of visible light, infrared light, ultraviolet light and the like is established, the defect recognition accuracy can be improved, and the inspection working efficiency and quality are improved.

The present invention provides a manufacturing method for an SOI wafer with a high productivity in which generation of a void is suppressed in manufacturing the SOI wafer. In a manufacturing method for an SOI wafer of the present invention in which two starting wafers are prepared, an insulating layer is formed on at least one of the two starting wafers and the one wafer is adhered to the other wafer without using an adhesive agent, the starting wafers each with no line defect on a surface thereof are used. In a manufacturing method for an SOI wafer of the present invention in which two starting wafers are prepared, an insulating layer is formed on at least one of the two starting wafers and the one wafer is adhered to the other wafer without using an adhesive agent, the starting wafers are subjected to a high temperature heat treatment in advance.

The invention discloses a T-shaped photonic crystal power divider, which belongs to the technical field of materials, and relates to application technology of photonic crystals. In the invention, based on the prior T-shaped photonic crystal power divider, one dielectric cylinder is added in the intersection of a vertical line defect and a horizontal line defect of a T-shaped line defect, and two dielectric cylinders most close to the added dielectric cylinder in the vertex position of two right-angle corners of the T-shaped line defect are removed respectively at the same time. Other dielectric cylinders can also be respectively added in the positions twice of a crystal cycle length which is constant a, from the added dielectric cylinder on the left side, the right side and the lower side, and three dielectric cylinders most close to the intersection of the vertical line defect and the horizontal line defect at the two right-angle corners of the T-shaped line defect are removed respectively at the same time. The improved T-shaped photonic crystal power divider has the advantages of high amplitude-frequency characteristic flatness in a pass band, reduction of interaction between two output ends of the T-shaped power divider and better practicability.

An apparatus and method for driving a liquid crystal display apparatus include a receiver for receiving input image data, a data processor for processing output image data output from the receiver, and a memory and a transmitter connected to the data processor. The data processor selects a portion of polarities from the output image data and generates a plurality of polarities of the same number as the portion of the polarities to generate polarity data for one frame. Thus, polarities of pairs of pixels corresponding to inversion units are sequentially inverted, so that arbitrary polarity inversion can be individually performed on the pixels. Therefore, preventing cross line defects that are caused from variation in charging voltages in a conventional two-dot inversion driving scheme that is performed in units of two adjacent pixel rows is possible. Further, reducing flicker caused by polarity inversion in units of one frame is also possible.

The present invention discloses an array substrate and a defect detecting method thereof. The array substrate comprises one or more shorting bars for applying signals to a plurality of data lines or a plurality of gate lines of the array substrate while testing. The array substrate further comprises a line detecting circuit for receiving signals on the plurality of data lines or the plurality of gate lines, and detecting and locating the line defects of the plurality of data lines or the plurality of gate lines. The array substrate and the defect detecting method thereof provided by the invention can locate the line defects of the array substrate accurately and quickly.

The present invention allows an efficient test as to the presence of line defects in data lines and gate lines in a liquid crystal display. A logic circuit for a test is provided according to the interconnect layout structure on a semiconductor substrate of a liquid crystal display, and ends of data lines are coupled to inputs of the logic circuit. At the time of the test, test drive signals corresponding to a certain logical value are applied to the data lines, and a determination is made as to defects in the data lines based on the output from the logic circuit, obtained in response to the signal application. This way means that determinations can be made as to defects in the data lines based on a logical value as the output from the logic circuit, i.e., binary values. Such a configuration is also applied to gate lines.

The invention relates to a textile defect detection method. The method comprise the steps that firstly, a to-be-detected textile image with the to-be-cut edge characteristics is collected, and a series of image preprocessing operations are performed on the collected to-be-detected image; secondly, sawteeth of the image are eliminated, and textile edges are roughly determined through an LSD straight line detection algorithm; thirdly, the accurate edge positions are obtained by transversely cutting a longitudinal average gray value variation diagram, real-time edge reference data are determined according to relevant parameters of an acquisition system, and then extracted edge information and the edge reference data are compared to determine the edges and count; defect distribution is determined by combining standard diagram characteristic parameters and ignoring the defects around the edges, all defect communicating regions are obtained by adopting a region growing method, and then the number of a textile where the detects are located is judged by combining the edge positions. According to the textile defect detection method, information reference determination is repeatedly performed on the textile edges, and therefore the precision of on-line edge counting is improved; fine and scattered defects are regrown and communicated, and therefore the precision of on-line defect detection is improved.