Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Test cluster building method and system and electronic equipment

A technology of electronic equipment and clusters, which is applied in the direction of faulty hardware testing methods and faulty computer hardware detection, and can solve problems such as the impact of big data platforms and waste of hardware resources

Inactive Publication Date: 2018-02-27
LENOVO (BEIJING) LTD
View PDF6 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the cluster manager manages the big data platform, it usually needs to perform some operations, such as upgrading, or adding / deleting certain components, etc., which usually have a great impact on the big data platform at this time
[0003] Related technologies provide a solution, that is, build a test cluster with the same configuration as the big data platform to test these operations in advance. However, in the process of implementing the embodiments of the present disclosure, the inventors found that related technologies have at least the following defects: due to A big data platform is usually composed of dozens or even hundreds of servers, so building a test environment with the same configuration as the big data platform is a great waste of hardware resources

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test cluster building method and system and electronic equipment
  • Test cluster building method and system and electronic equipment
  • Test cluster building method and system and electronic equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] Hereinafter, embodiments of the present disclosure will be described with reference to the drawings. It should be understood, however, that these descriptions are exemplary only, and are not intended to limit the scope of the present disclosure. Also, in the following description, descriptions of well-known structures and techniques are omitted to avoid unnecessarily obscuring the concept of the present disclosure.

[0025] The terminology used herein is for the purpose of describing particular embodiments only, and is not intended to be limiting of the present disclosure. The terms "comprising", "comprising", etc. used herein indicate the presence of stated features, steps, operations and / or components, but do not exclude the presence or addition of one or more other features, steps, operations or components.

[0026] All terms (including technical and scientific terms) used herein have the meaning commonly understood by one of ordinary skill in the art, unless otherw...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a test cluster building method. The test cluster building method includes the online cluster configuration information is obtained and includes the type of service assemblies included by all hosts in an online cluster; based on the configuration information, a test cluster used for simulating the online cluster is built, wherein the service assembly types included by the test cluster are identical with that included by the online cluster, and the number of hosts included by the test cluster is smaller than that of hosts included by the online cluster. The invention further provides a testing cluster building system and electronic equipment.

Description

technical field [0001] The present disclosure relates to a method for building a test cluster, a system thereof, and electronic equipment. Background technique [0002] A big data platform is usually a server cluster composed of many distributed services, and is managed by a cluster manager. When the cluster manager manages the big data platform, it usually needs to perform some operations, such as upgrading, or adding / deleting certain components, etc., which usually have a great impact on the big data platform. [0003] Related technologies provide a solution, that is, build a test cluster with the same configuration as the big data platform to test these operations in advance. However, in the process of implementing the embodiments of the present disclosure, the inventors found that related technologies have at least the following defects: due to A big data platform is usually composed of dozens or even hundreds of servers, so building a test environment with the same con...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/2273
Inventor 李亚坤
Owner LENOVO (BEIJING) LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com