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Test method for polarized reflection characteristics of narrow pulse laser target

A polarization reflection and characteristic testing technology, applied in the direction of scattering characteristic measurement, polarization influence characteristics, etc., can solve the problems that restrict the development of narrow pulse laser short-range detection technology, incomplete target reflection characteristic database, target polarization reflection characteristic and complex ground objects Problems such as unclear differences in environmental characteristics can achieve the effect of improving accuracy and shielding external interference

Active Publication Date: 2020-06-30
CHANGCHUN UNIV OF SCI & TECH
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Problems solved by technology

The database of target reflection characteristics in our country is not complete, and the difference between the target polarization reflection characteristics and complex ground object environment characteristics is not yet clear. When the pulsed laser is irradiated on the target, the reflection characteristics of the target surface will affect the acquisition of the target by the receiving system. Detection and locking tracking, due to the lack of relevant research on the reflection characteristics of conventional weapons targets, severely restricts the development of narrow-pulse laser short-range detection technology in China

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  • Test method for polarized reflection characteristics of narrow pulse laser target
  • Test method for polarized reflection characteristics of narrow pulse laser target

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Experimental program
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Embodiment 1

[0038] To test the circularly polarized light reflection polarization characteristics of a 1064nm narrow pulse laser on a metal plate in a 60-degree direction, the system structure diagram is as follows figure 2 .

[0039] Step 1, the placement position of selected target and background test platform 1 and narrow pulse laser 4, makes the angle between target and background test platform 1 and narrow pulse laser 4 be 60 degrees, and described target and background test platform 1 include Test the turntable and the stepping motor, place a background calibration plate on the test turntable, control the stepper motor to drive the test turntable to rotate through the computer system 8, so that the test turntable rotates to a predetermined horizontal orientation and pitch angle according to the set rotation angle parameters;

[0040] Step 2, the narrow pulse laser 4 emits a narrow pulse laser with a wavelength of 1064nm, and the narrow pulse laser emitted by the narrow pulse laser ...

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Abstract

The method for testing the polarized reflection characteristics of a narrow pulse laser target belongs to the field of target characteristic testing, and is specifically as follows: select the angle between the target and the background test platform and the narrow pulse laser, and control the target and the background test platform through the computer system to make the test turntable according to the set rotation angle The parameters are rotated to the predetermined horizontal azimuth and elevation angle; the narrow pulse laser emits narrow pulse laser light, passes through the optical system Ⅰ, the polarizing device generates the required polarized light, and then irradiates the background calibration plate or the target to be measured, and the reflected light passes through the optical system Ⅱ After the polarization analyzer enters the data processing receiving end, the data processing receiving end collects polarization information and sends the information to the computer system, and the polarization bidirectional reflection characteristics of the narrow pulse laser target are obtained through computer system analysis. The method of the invention realizes the research on the full polarization reflection characteristics of the narrow pulse laser target.

Description

technical field [0001] The invention belongs to the field of target characteristic testing, in particular to a method for testing the polarized reflection characteristic of a narrow-pulse laser target. Background technique [0002] The currently detected subjects are usually low-detectable targets under natural and artificial targets such as vegetation, rocks, soil, buildings, etc. The performance of optoelectronic devices that rely on intensity detection is greatly reduced, and it is urgent to develop advanced polarization detection and identification technology. Compared with the natural environment, man-made targets have obvious differences in polarization characteristics. Therefore, polarization imaging has advantages in highlighting targets from complex backgrounds, improving the contrast of stealth and camouflaged targets, and reducing false alarm rates. Therefore, it is very important to carry out research on the polarization characteristics of targets and backgrounds...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/21G01N21/55
CPCG01N21/21G01N21/55
Inventor 战俊彤付强张肃段锦姜会林
Owner CHANGCHUN UNIV OF SCI & TECH