X-ray optical device

Abstract

Provided is an X-ray optical device for use in X-ray analysis systems. The X-ray optical device comprises: an X-ray source configured to emit X-rays; an X-ray optics configured to image a beam of X-rays generated by the X-ray source onto a sample to be analyzed; and a beam blocking unit arranged for selectively blocking off at least a portion of the X-ray beam output by the X-ray optics. The beamblocking unit comprises a rotating shaft and a beam blocking element, wherein the rotating shaft is rotatable around its axis and arranged laterally offset with respect to the X-ray beam output by theX-ray optics, and wherein the beam blocking element is mounted eccentrically on the rotating shaft such that the beam blocking element is movable into different beam overlap positions for blocking off corresponding portions of the output X-ray beam when the beam blocking element is eccentrically rotated around the rotating shaft axis. Also provided is an X-ray analysis system for analyzing crystalline or powder samples, comprising the above X-ray optical device, a sample stage and an X-ray detector.

Description

Technical field [0001] The present invention generally relates to the field of X-ray analysis. More particularly, the present invention relates to an X-ray optical device. Background technique [0002] X-ray analysis techniques such as X-ray diffraction (or XRD) have become very popular because they can perform non-destructive analysis of samples. For example, X-ray diffraction has become one of the basic experimental techniques used to study the structural characteristics of protein or other macromolecular crystal samples. Generally, the preparation of crystalline macromolecular samples is challenging. Generally, samples are very small and an X-ray diffractometer capable of directing a focused X-ray beam with a small cross-sectional size and high intensity onto the small sample is required. [0003] Such an X-ray diffractometer is described in DE 10 2004 052 350A1 and US 2010 / 0086104A1, and the X-ray diffractometer includes an X-ray source that emits X-rays, and is designed to ...

AI Technical Summary

Problems solved by technology

First, micrometric or fine thread screws are very expensive and very sensitive to external influences

In addition, apertures with micrometric screws are difficult to implement in airtight housings that typically receive reflective optics

Furthermore, it is difficult to control the motion of the aperture blades with micrometric screws, because the motion parameters (e.g. starting position, end stop, change in direction of rotation) must be precisely defined

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