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ESD test device

A test device and test bit technology, applied in the direction of measurement device, measurement of electricity, measurement of electric variables, etc., can solve the problems of inapplicable IC pin test, simultaneous strike of FPC connector pins, etc., and achieves simple structure and high reliability. , easy to use effect

Active Publication Date: 2018-10-19
KUNSHAN GO VISIONOX OPTO ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the ESD test method for IC is mainly to test the IC pin directly, but this test method is not suitable for the IC pin test after bonding with the screen
Another test method is to use an electrostatic gun to hit the FPC connector of the screen body to perform IC ESD testing. However, due to the large head of the electrostatic gun, it is easy to cause multiple pins on the FPC connector to be hit at the same time, which is not conducive to each IC. pins to detect

Method used

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  • ESD test device

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Comparison scheme
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Embodiment

[0033] The embodiment of the present invention provides a kind of ESD testing device, such as figure 1 As shown, the test fixture body 1 is included. The test fixture body 1 is provided with a number of test positions 11. The test positions 11 are electrically connected to the electrical connection components. The electrical connection components are used to bond with the IC on the screen body 3. Pin 31 is electrically connected. Wherein, the test fixture body 1 is made of bakelite material, and the test position 11 is a metal ESD impact point arranged on the test fixture body 1 .

[0034] In the ESD testing device provided in this embodiment, a test bit 11 is provided on the test fixture body 1, and then the test bit 11 is electrically connected to the IC pin 31 bonded to the screen body 3 through an electrical connection component. When it is necessary to perform ESD detection on the IC pin 31 bonded on the screen body 3, it is only necessary to detect the test bit 11 on th...

Embodiment approach

[0035] As an embodiment of the present invention, the electrical connection assembly in this embodiment includes a first inner lead 21 disposed on the test fixture body 1 . The test bit 11 is electrically connected to the IC pin 31 through the first inner lead 21 of the fixture body. The setting of the first internal lead wire 21 plays the role of electrical signal transmission on the one hand; on the other hand, it is beneficial to keep a certain distance between the test position 11 on the fixture body and the IC pin 31 bonded on the screen body 3, During detection, avoid the electrostatic gun from directly hitting IC pin 31, causing interference.

[0036]As an embodiment of the present invention, the test fixture body 1 in this embodiment is also provided with a first preset connection position 12, and the first preset connection position 12 is electrically connected to the electrical connection assembly; the first preset Connection bit 12 is used for electrical connection...

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PUM

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Abstract

The invention relates to the technical field of display. An ESD test device includes a test tool body. The test tool body is provided with multiple test positions. The test positions are electricallyconnected to an electrical connection assembly. The electrical connection assembly is used for electrically connecting with an IC pin. When ESD detection needs to be carried out on the IC pin bound toa screen body, the ESD detection of the IC pin can be realized only by detecting the test positions on the test tool body, and so the problem of a conventional device that an FPC connector is struckwith an electrostatic gun and multiple pins of an FPC are struck at the same time because of the large size of the gun head of the electrostatic gun which affects the detection of IC pin is avoided. The ESD test device provided by the invention can effectively carry out the ESD detection on the IC pin bound to the screen body, has high reliability, and is convenient in usage and simple in structure.

Description

technical field [0001] The invention relates to the field of display technology, in particular to an ESD testing device. Background technique [0002] Electro-Static discharge (ESD) refers to the phenomenon that when two objects with different electrostatic potentials are close to each other to a certain extent or in contact, static electricity suddenly flows from one object to another. The generation of static electricity is inevitable in industrial production, and it is easy to cause various hazards, such as causing failure or malfunction of electronic equipment, causing electromagnetic interference; breakdown of integrated circuits and precision electronic components, or aging of components, reducing production Yield rate etc. [0003] Especially in the field of display technology, because most of the display substrates are made of insulating glass, the static elimination speed is slow, and a large amount of electrostatic charge is easy to accumulate on the surface of th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/001
Inventor 袁来生
Owner KUNSHAN GO VISIONOX OPTO ELECTRONICS CO LTD