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LOF outlier detection method based on k-d tree

An outlier detection, k-d technology, applied in the computer field, can solve the problems of low detection efficiency of large-scale data sets, high time and space complexity, and high computational overhead, so as to achieve real-time detection and overcome time and space complexity. The effect of high degree and fast search

Inactive Publication Date: 2018-11-09
XIDIAN UNIV
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Problems solved by technology

[0005] The purpose of the present invention is to address the above-mentioned deficiencies in the prior art, and propose a LOF outlier detection method based on k-d tree, to solve the current LOF outlier detection method to large-scale data set detection efficiency is not high and exist in the calculation process The problem of excessive computational overhead
The invention overcomes the problem that the LOF outlier detection method in the prior art has high time and space complexity when processing real-time large-scale high-dimensional data objects, resulting in poor practicability, and ensures outlier detection under large-scale data sets At the same time, the efficiency and practicality of the calculation process are improved

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  • LOF outlier detection method based on k-d tree
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Embodiment Construction

[0041] The present invention will be further described below in conjunction with the accompanying drawings.

[0042] refer to figure 1 , the specific implementation steps of the present invention are further described.

[0043] Step 1, capture the data flow in the local area network, and form all the data objects in the data flow into a k-dimensional data set space.

[0044] Step 2, obtain the segmentation dimension.

[0045]Calculate the variance value of the data objects in each dimension in the dataset space by using the formula for calculating the variance value of the data objects in each dimension in the dataset space.

[0046] The formula for calculating the variance value of each dimension of the data objects in the data set space is as follows:

[0047]

[0048] in, Represents the variance value of the i-th dimension of the data object in the k-dimensional data set space, 1≤i≤m, m represents the dimension of the data object, X ji Indicates the attribute value...

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Abstract

The invention discloses an LOF (Local Outlier Factor) outlier detection method based on a k-d tree, and mainly solves the problem that the current LOF outlier detection method is high in time and space complexity during outlier detection. The technical scheme is as follows: the k-d tree is used to store data objects in the k-dimensional space for fast retrieval; the k-d tree is constructed by segmenting the k-dimensional data space with a hyperplane perpendicular to a coordinate axis; each node of the k-d tree corresponds to one k-dimensional hyper-rectangular region; and all outlier detectionis performed on the k-d tree structure. The LOF outlier detection method based on a k-d tree provided by the invention overcomes the problem that the LOF outlier detection method in the prior art hashigh time and space complexity and poor practicability when processing real-time large-scale high-dimensional data objects, and improves the efficiency and practicability of the calculation process while ensuring the accuracy of the outlier detection under a large-scale data set.

Description

technical field [0001] The invention belongs to the technical field of computers, and further relates to a method for detecting outliers based on a local outlier factor LOF (Local Outlier Factor) of a k-d tree in the technical field of data mining. The k-d tree is a tree-shaped data structure that stores data objects in the k-dimensional space for fast retrieval. It splits the k-dimensional data structure into a k-nearest neighbor search space partition tree to build a hierarchical structure of data objects. The invention can be used to mine outliers in a data set composed of network data streams, reduce time and space complexity during outlier mining while ensuring mining accuracy, and realize efficient mining of outliers. Background technique [0002] Outlier mining technology is an important research direction of data mining technology. By mining outliers, we can find potential useful information in the data set. Among them are deeper, potential and valuable information....

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/30
Inventor 马文平胡惠敏
Owner XIDIAN UNIV
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