Plasma based object characterization detection method and device
A plasma and detection method technology, which is applied in the field of material characterization and detection, can solve the problems of the detection result, such as the great influence of the probe, the high requirements of the probe, and the characterization error, so as to reduce experimental consumables, avoid probe pollution, reduce cost effect
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[0023] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.
[0024] Such as figure 1 Shown is a schematic flowchart of a plasma-based object characterization detection method provided by an embodiment of the present invention. figure 1 The methods shown include:
[0025] S1, using plasma as a probe;
[0026] S2. According to the result of the interaction between the probe and the surface of the object to be measured, the contour of the surface of the o...
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