A structured light adaptive three-dimensional measurement method based on camera response curve

Abstract

This application provides a structured light adaptive three-dimensional measurement method based on the camera response curve, including the preset measurement gray value range and exposure time range, and obtain a reference image and reference exposure time within the preset measurement range; The reference point, and calculate the camera response function according to the exposure and gray value obtained with the change of the exposure time of the reference point; use the camera response function to obtain the relative irradiance value of all points, based on the relative irradiance value and The camera response function is used to calculate the number of exposures and exposure time; the images acquired at different exposure times are fused into a new fringe image sequence and used for 3D reconstruction. The invention can self-adaptively reconstruct objects with complex surface reflectance, expands the application range of structured light measurement technology, improves the automation degree of measurement, and can also achieve good measurement effect on complex reflectance surfaces.

Description

technical field [0001] The invention belongs to the technical field of optical measurement, in particular to a structured light adaptive three-dimensional measurement method based on a camera response curve. Background technique [0002] Structured light measurement technology is an active optical measurement that projects a certain pattern of grating fringe images onto the surface of the object to be measured, and the camera acquires the deformed grating image modulated by the shape of the object to be measured, and then calculates the three-dimensional information data of the object to be measured. technique, which is very sensitive to the intensity of the raster image. When the surface is overexposed or underexposed, such as specular reflection, the camera imaging cannot truly reflect the true intensity value of the surface, resulting in a decrease in measurement accuracy or failure to reconstruct. The multiple exposure technology is applied in the structured light recon...

AI Technical Summary

Problems solved by technology

Although the method of structured light technology combined with multiple exposures has achieved good measurement results, the exposure time and number of exposures are all based on operator experience, which affects measurement efficiency and industrial applications.

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