Realization method of platform compatible with two factors

An implementation method and factor technology, applied in the implementation field compatible with two factor platforms, can solve problems such as inconvenience, different calculation methods and storage methods, incompatibility of equipment platforms, etc., and achieve the effect of simplifying the difficulty of calibration coding and reducing professional knowledge requirements.

Active Publication Date: 2018-11-16
FUJIAN NEBULA ELECTRONICS CO LTD
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] However, because the equipment developed in the early stage used FK / FB as the calibration factor, while the equipment currently developed uses K / B as the calibration factor, and the calculation methods and storage methods of the two calibration factors are different, resulting in two The device platform of the calibration factor is not compatible, which brings a lot of inconvenience to the actual use

Method used

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  • Realization method of platform compatible with two factors
  • Realization method of platform compatible with two factors
  • Realization method of platform compatible with two factors

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specific Embodiment approach 1

[0049]In the technical solution of the specific embodiment 1, the K / B factor platform is fused into the equipment with FK / FB as the calibration factor for illustration.

[0050] Please refer to figure 1 As shown, the present invention is an implementation method compatible with two factor platforms, and the method includes the following steps:

[0051] Step S1, retain the FK / FB factor of the original FK / FB calibration platform in the MCU storage driver layer; that is, keep the FK / FB factor storage mode of the original FK / FB calibration platform (including the format and stored address) unchanged.

[0052] Step S2, adding a K / B factor calibration method in the host computer, so as to realize the integration of the K / B calibration platform into the original FK / FB calibration platform;

[0053] During specific implementation, the step S2 specifically includes:

[0054] Step S21, keeping the calibration method and function interface of the original FK / FB factor unchanged;

[0...

specific Embodiment approach 2

[0068] In the technical solution of the specific embodiment 2, the FKF / B factor platform is fused into the equipment with K / B as the calibration factor for illustration.

[0069] Please refer to image 3 As shown, an implementation method compatible with two factor platforms, the method includes the following steps:

[0070] Step W1, retain the K / B factor of the original K / B calibration platform in the MCU storage driver layer; that is, keep the K / B factor storage mode of the original K / B calibration platform (comprising the K / B factor format and stored address) unchanged.

[0071] Step W2, adding a calibration method for FK / FB factors in the host computer, so as to realize the integration of the FK / FB calibration platform into the original K / B calibration platform;

[0072] During specific implementation, the step W2 specifically includes:

[0073] Step W21, keeping the calibration method and function interface of the original K / B factor unchanged;

[0074] Step W22, incr...

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Abstract

The invention provides a realization method of a platform compatible with two factors. The method comprises that an FK/FB factor of an original FK/FB calibration platform is reserved in an MCU storagedriving layer; a K/B factor calibration method is added to a host computer; an hijacking code of the FK/FB factor is added to an MCU application layer, and the FK/FB factor is initialized; the addedhijacking code is used to hijack an unloading command of the FK/FB factor in the MCU application layer, and a K/B factor is refreshed according to the unloading command of the FK/FB factor; and a FK/FB factor command for analog test and loading in the original FK/FB calibration platform is kept unchanged, a K/B factor command for analog test and loading is added, and the K/B factor command is usedto make interaction between the MCU application layer and the host computer by using a practical value directly. The method is used to realize compatibility between FK/FB factor and K/B factor equipment platforms, and great convenience is provided for practical use.

Description

technical field [0001] The invention relates to the field of circuit system testing, in particular to a realization method compatible with two factor platforms. Background technique [0002] Due to the existence of certain errors in the circuit system, the output value of the analog measurement and loading will have a certain deviation from the ideal actual value, and the general error is a linear error. The linearity error can be calibrated by a binary primary calibration method (engineering value*K+B=actual value), where the engineering value is an uncalibrated voltage, current, etc. [0003] The KB calibration method is the most commonly used calibration method. The following uses the analog measurement as an example to illustrate: When performing analog measurement, the MCU measures the analog value and returns it as AD value = 0-2 分辨率 , such as the 24-bit AD value is: 0-16777216; MCU or host computer performs engineering value conversion, engineering value = AD value *...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R35/00
CPCG01R35/005
Inventor 李有财熊刚杨建状高辉辉
Owner FUJIAN NEBULA ELECTRONICS CO LTD
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