Diode and triode testing circuit, circuit board and detector

Abstract

The invention discloses a diode and triode testing circuit, a circuit board and a detector. The circuit comprises a power module, a selection module, a transistor protection module, a first 555 timer,a second 555 timer, a display module, a triode interface module and a diode interface module, wherein the fourth pin and the eighth pin of the first 555 timer and the fourth pin and the eighth pin ofthe second 555 timer are all connected with the power module; the second pin and the sixth pin of the first 555 timer are connected and then divided into two paths, wherein one path is connected withthe second pin and the sixth pin of the second 555 timer through a resistor R1, and the other path is connected with the ground through a capacitor C; the third pin of the first 555 timer and the second pin of the second 555 timer are connected to serve as a cathode of the diode interface module, and the third pin of the first 555 timer and the sixth pin of the second 555 timer are connected to serve as an emitter of the triode interface module; and the output end of the second 555 timer is connected with the selection module. The circuit has the advantage that it is convenient to test various states of diodes and triodes.

Description

technical field [0001] The invention relates to the field of testing circuits, in particular to a circuit, a circuit board and a detector for testing diodes and triodes. Background technique [0002] With the continuous development of modern information technology in our country, electronic products occupy an important position and role in people's daily life, among which semiconductor devices are an important part of electronic equipment. In the process of continuous development of electronic equipment, semiconductor components play an important role and significance, and play a decisive role in the normal operation of the entire electronic product. However, during the operation of electronic components, some basic components, such as diodes and triodes, often have various problems, which seriously or even hinder the progress of experiments and the development of electronic technology. Therefore, under such circumstances, the detection of semiconductor components is very i...

AI Technical Summary

Problems solved by technology

In addition, in the teaching experiments of colleges and universities, such as analog electronic technology experiments, digital electronic technology experiments, electronic engineering experiments, etc., large-scale use of experimental boxes is required, and students often cause some elements to be damaged due to improper operation or lack of rigor. Component failures lead to the failure of experiment results and affect the teaching effect. Among them, diodes and triodes are the components with the highest failure frequency. At this time, an instrument that can quickly detect failures is especially needed

[0003] At present, with the advancement of electronic technology, some methods are outdated and useless

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