A lens profile acquisition method and device suitable for terahertz security inspection
A contour surface and terahertz technology, which is applied in the field of terahertz security inspection, can solve the problems of affecting the imaging effect of short-range and large-angle scanning security inspection, poor focusing effect, and low imaging resolution, so as to improve the efficiency of security inspection imaging, improve resolution, good focus effect
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Embodiment 1
[0060] refer to figure 1 , which shows a flow chart of the steps of a method for obtaining a lens profile surface applied to a terahertz security imaging system according to the present invention, which may specifically include the following steps:
[0061] Step 101: Obtain the preset maximum imaging angle, focal length and thickness of the lens.
[0062] The lens in the embodiment of the present invention is placed in a terahertz security inspection device and applied to a terahertz security inspection imaging system.
[0063] The terahertz security detector works in the THz band (between the infrared and the microwave), and can use high sensitivity according to the differences in radiation, reflection and transmission capabilities between the human body and metals, ceramics, plastic explosives, powder explosives, clothing, and insulating materials. The terahertz wave detection system acquires the radiation characteristics of the target; and then generates an image visible t...
Embodiment 2
[0093] refer to Figure 5 , shows the flow chart of specific steps of the method for obtaining feature points on the surface of the lens contour in the present invention:
[0094] Step 201: The acquisition of the preset maximum imaging angle, focal length and thickness of the lens.
[0095] In the embodiment of the present invention, take the optical axis as the abscissa, and take the center of the two focal points of the lens as the origin to establish the coordinate axis (the focal point of the required lens is a preset known quantity), because the fitted lens in the embodiment of the present invention has a symmetrical Therefore, we only need to fit the contour surface curve of the part above the optical axis, and then obtain the characteristic curve of the entire contour surface according to the symmetry.
[0096] In this example, if Image 6 shown, with focus F 1 (0,y m ) multiple intersections of the beam emitted by the lens surface and the lens surface are used as f...
Embodiment 3
[0143] refer to Figure 7 , shows a structural block diagram of an apparatus 300 for obtaining a lens profile surface in an embodiment of the present invention. include:
[0144] The data acquisition module 301 is used to acquire the preset imaging maximum angle, as well as the focal length and thickness of the lens;
[0145] The data processing module 302 is configured to determine the coordinates of a plurality of first feature points belonging to the characteristic curve of the first surface by using the Snell model and the equi-path model according to the lens thickness, focal length, and preset maximum imaging angle, and a plurality of second characteristic point coordinates belonging to the second surface characteristic curve;
[0146] The first curve fitting module 303 is configured to fit the coordinates of the plurality of first feature points to obtain the first surface characteristic curve;
[0147] The second curve fitting module 304 is configured to fit the coo...
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