System for defect inspection and method for defect inspection

Abstract

The present invention provides a defect inspection system and a defect inspection method. In the defect inspection system (1), a two-dimensional image of which the brightness changes in the conveyingdirection (X) is shot by a camera unit (3), and is processed into image data of column segmentation images in a manner that columns at the same position of the two-dimensional image are arranged according to the order of a time sequence; the column segmentation images with different brightness are divided into a plurality of column segmentation image groups by means of a classification unit (10);by means of a merging unit (11), the pixel values of the image data obtained by photographing the same position of the inspection object (T) in the column segmentation image are merged with each other; image merging data is generated based on the column segmentation image groups. The image merging data is divided and output based on the preset rule by means of a segmentation output unit (12). Thesegmentation is conducted based on the preset rule, and the showing manner of the images of the merging data is different, and the types of the defect can be easily identified.

Description

technical field [0001] The present invention relates to a defect inspection system and a defect inspection method. Background technique [0002] As a defect inspection system that inspects defects of an inspection object based on captured images of the inspection object, for example, defect inspection systems that detect defects in optical films such as polarizing films and retardation films, laminated films used in battery separators, and the like are known. . Such a defect inspection system transports a film along a transport direction, captures two-dimensional images of the film at discrete times, and performs defect inspection based on the captured two-dimensional images. For example, the system of Japanese Patent No. 4726983 generates a column-segmented image by dividing a two-dimensional image into a plurality of columns arranged along the transport direction, and making each of the two-dimensional images captured at discrete times Columns at the same position are ar...

AI Technical Summary

Problems solved by technology

However, in the above-mentioned technology, the values ​​of the pixels of the image data of the defect enhancement processing image are accumulated and merged, so that the protrusion and depression information of the defect disappears or cancels each other out, and it is difficult to identify the type of the defect, and improvement is desired.

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