Pulse X-ray irradiation device for active ionizing radiation dosimeter test

An irradiation device and ionizing radiation technology, applied in irradiation devices, radiation measurement, instruments, etc., can solve the problems of affecting the accuracy of monitoring results, missed events, low measurement results, etc., to solve the inability to accurately measure pulse radiation, good Stability and repeatability, reducing the effect of scattered radiation

Pending Publication Date: 2019-03-15
CHINA INSTITUTE OF ATOMIC ENERGY
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AI Technical Summary

Problems solved by technology

First of all, the problem of high dose rate, such as a ms-level radiation pulse, its single pulse dose often reaches 1μSv or even higher, and the instantaneous dose rate of pulse radiation can reach more than 100Sv / h. However, for G-M counters, semiconductor detectors, etc. There are problems of measurement accumulation and detection dead time, and it is difficult to achieve such a high dose rate response, that is, the instrument has an over-response problem, which will inevitably affect the accuracy of the monitoring results; secondly, the response time problem, active ionizing radiation dosimeters have measurement time Period, the interval between two measurement cycles can reach several seconds. If the pulse radiation happens to happen within the interval of the meter measurement cycle, it is very likely that an omission event will occur, which will greatly affect the accuracy of the measurement results and cause the measurement results to be seriously low; finally, Accident alarm problem, if a large dose of pulse just happens within the measurement interval of the instrument, there will inevitably be a missed report event, which will bring great safety hazards to the radiation practitioners

Method used

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  • Pulse X-ray irradiation device for active ionizing radiation dosimeter test

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Embodiment Construction

[0013] Embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0014] Pulse X-ray irradiation device for active ionizing radiation dosimeter test according to the present invention, see figure 1 , including radiation system, adjustment system, support system, monitoring system and control system.

[0015] Wherein the support system comprises a test platform 11 and a backing plate 12, the test platform is a circular truncated support frame, and the backing plate 12 is arranged on the bottom of the test platform 11, and is an aluminum plate with a certain thickness, preferably a thickness of 5-10mm, the backing plate 12 can effectively reduce the scattered radiation on the ground. During the test, the tested instrument 10 is placed in the test area of ​​the test platform, which is located below the adjustment system.

[0016] Wherein, the radiation system is arranged on the top of the test platform 11 , which includ...

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Abstract

The invention provides a pulse X-ray irradiation device for an active ionizing radiation dosimeter test. The device adopts a pulse X-ray machine as a radiation source, X-rays with different energies can be obtained by adjusting the tube voltage of the pulse X-ray machine, thereby providing test service with the X-rays with different energies for the active ionizing radiation dosimeter. The irradiation device can provide the test of the pulse X-rays for the active ionizing radiation dosimeter, improve the accuracy and effectiveness of the radiation measurement.

Description

technical field [0001] The present invention relates to a pulsed X-ray irradiation device, more particularly to a pulsed X-ray irradiation device used for active ionizing radiation dosimeter testing. Background technique [0002] Active ionizing radiation dosimeters are widely used in dose monitoring of radiation fields, and their direct-reading display mode and alarm function provide safety guarantee for practitioners. The active ionizing radiation dosimeter has the following problems when measuring the pulsed radiation field dose. First of all, the problem of high dose rate, such as a ms-level radiation pulse, its single pulse dose often reaches 1μSv or even higher, and the instantaneous dose rate of pulse radiation can reach more than 100Sv / h. However, for G-M counters, semiconductor detectors, etc. There are problems of measurement accumulation and detection dead time, and it is difficult to achieve such a high dose rate response, that is, the instrument has an over-res...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T7/00G21K5/04
CPCG01T7/005G21K5/04
Inventor 高飞徐阳
Owner CHINA INSTITUTE OF ATOMIC ENERGY
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