Device and method for testing short-circuit protection of a VR chip before power-on

Abstract

The innovation of the invention proposes a device and a method for testing pre-power short circuit protection of a VR chip. By adding a voltage regulator module and adjusting the working timing of thepower supply terminal VCC and the voltage input terminal of the chip, the real working condition of the NCP4552x series chip can be truly reflected, thereby avoiding chip breakdown damage, improvingtest efficiency and reducing test costs.

Description

technical field [0001] The invention relates to the field of chip testing, in particular to a short-circuit protection testing device and method before power-on of a VR chip. Background technique [0002] During the development stage of server motherboards and other boards, it is necessary to test and verify whether the VR (Voltage Regulation, voltage regulator) chip has a short-circuit protection function. The test standard requires short-circuit before power-on, VR has protection, and short-circuit after power-on, VR has protection. [0003] At present, for the short circuit protection test before VR is powered on, it is necessary to use a load meter to perform a forced short circuit, and lead out the three signals VIN, POWERGOOD (voltage output is normal), and VOUT of the VR chip through welding flying leads, and then use three single-ended probes Connect these 3 sets of signals to the oscilloscope, and connect the other channel of the oscilloscope to the current probe t...

AI Technical Summary

Problems solved by technology

[0004] However, during the actual measurement of the NCP4552x series chips, it was found that the chip was broken down and damaged during the short-circuit protection test before power-on with the conventional test method, and the chip design manual shows that the chip has a short-circuit protection function.

Therefore, when performing short-circuit protection tests on NCP4552x series chips, using the existing technology to test is likely to cause chip breakdown and damage, which cannot truly reflect the real working conditions of VR chips, which is not conducive to improving test efficiency.

Images