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Common mode inductance test mechanism

A technology of testing mechanism and common mode inductance, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve problems such as outflow, influence, and hidden dangers of defective products, and achieve the effects of improving automation, eliminating subjectivity, and optimizing quality

Active Publication Date: 2019-06-14
HAINING LIANFENG DONGJIN ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the subjective consciousness of manual judgment, and the alarm sound of the instrument will also be affected by the environment of the whole workshop
Therefore, the conventional instrument testing method has certain hidden dangers, that is, the defective products will flow out to the client

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0021] Example one, reference Figure 1 to Figure 3 As shown, a universal common-mode inductance electrical parameter test equipment includes a rack, a pipeline set on the rack for conveying inductance 1, an inductance withstand voltage test device set along the conveying direction of the pipeline 2, and a poor discharge withstand voltage The device, the inductance comprehensive electrical parameter test device 3, the inductance withstand voltage test device is used to perform a withstand voltage test on the inductance, the inductance comprehensive electrical parameter test device is used to test the electrical parameters of the inductor, and the withstand voltage poor discharge device When the inductance withstand voltage test fails, the unqualified inductor is removed from the pipeline. The present invention utilizes pipeline directional feeding, and the inductance to be tested passes through the withstand voltage test station (corresponding to the inductance withstand voltag...

Embodiment 2

[0034] Example two, reference Figure 4 with Figure 5 As shown, on the basis of the first embodiment, in order to further detect other performance parameters of the inductor. A third test station is provided downstream of the inductance comprehensive electrical parameter test device, and other performance tests of the inductance can be performed at the third test station. In this way, there is no need to set up the good product lane and the bad product lane in Example 1. However, in order to remove the bad inductance from the assembly line to ensure that the good inductance is transported along the assembly line to the third test station for testing, the assembly line in this embodiment has an interruption part between the inductance comprehensive electrical parameter test device and the third test station. 12. Below the interruption part, there is an obliquely arranged defective product lowering channel 121. At the same time, a third manipulator 4, a third test station, and ...

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Abstract

The invention discloses a common mode inductance test mechanism. The common mode inductance test mechanism comprises a rack, an assembly line which is used for transfusing inductance and is arranged on the rack, an inductance withstand voltage test device arranged in the assembly line conveying direction, a withstand voltage defective discharging device and an inductance comprehensive electrical parameter testing device, wherein the inductance withstand voltage test device is used for test the withstand voltage of the inductance, the inductance comprehensive electrical parameter testing deviceis used for testing the electrical parameter of the inductance, and unqualified inductance is removed from the assembly line through a withstand voltage defective discharging device when the inductance withstand pressure test is not qualified. According to the common mode inductance test mechanism, unmanned electrical performance parameter testing is realized, an OK product and a NG product device are automatically distinguished and discriminated, subjectivity of human judgment is removed, and product optimizing is achieved.

Description

Technical field [0001] The invention relates to the technical field of inductance automated testing. Background technique [0002] At present, the conventional methods of withstand voltage testing and comprehensive electrical parameter testing of electronic products are single-person operation, the instrument prompts good or bad products, and manual screening of OK products and NG products. Due to the subjective awareness of manual judgment, the environment of the entire workshop will also be affected when the instrument prompts the alarm. Therefore, the conventional instrument test method has certain hidden dangers, that is, the outflow of defective products to the client. Summary of the invention [0003] The technical problem to be solved by the present invention is to provide a common mode inductance test mechanism, which realizes automatic test of inductance and automatically separates bad inductance from good inductance. [0004] In order to solve the above technical problem...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/01
Inventor 邹晨炼沈利峰周晓媛
Owner HAINING LIANFENG DONGJIN ELECTRONICS