Integrated circuit chip testing and sorting machine reclaiming device and control method

Abstract

The invention relates to a material collecting device for an integrated circuit chip testing sorting machine. The material collecting device comprises a material pipe conveying device, a material pipetilting device and a material conveying device which are sequentially arranged in the moving direction of materials. The upper surface of the initial section of the material conveying device is tilted upwards by means of circular arc transition. The material pipe tilting device can be rotated to be tangent to the initial section of the material conveying device. The material pipe tilting device is tightly adjacent to the initial end of the material conveying device for arrangement along one end of the material moving direction, and the distance between the material pipe tilting device and thematerial conveying device is smaller than the length of one material. According to the material collecting device for the integrated circuit chip testing sorting machine and the control method provided by the invention, the device structure is reliable, the degree of automation is high, the degree of dependence on manpower is low, the whole working process is accurate and stable and safety is improved.

Description

Technical field: [0001] The invention relates to a material retrieving device and a control method of an integrated circuit chip testing and sorting machine. Background technique: [0002] The integrated circuit chip testing and sorting machine is mainly used in the post-production of semiconductor chips. It can automatically complete the appearance and size inspection of chips, electrical parameter testing, laser printing marking, marking inspection, classification, screening and storage, and final taping and packaging output; when used The all-in-one machine needs to be reclaimed first. The existing retrieving mechanism has a complex structure and a low degree of automation. Many steps require manual intervention and the retrieving is unstable, and it is easy to cause the material to drop or cause damage. Invention content: [0003] The object of the present invention is to provide a retrieving device and control method for an integrated circuit chip testing and sorting ...

AI Technical Summary

Problems solved by technology

[0002] The integrated circuit chip testing and sorting machine is mainly used in the post-production of semiconductor chips. It can automatically complete the appearance and size inspection of chips, electrical parameter testing, laser printing marking, marking inspection, classification, screening and storage, and final tape and packaging output; when used The all-in-one machine needs to be reclaimed first. The existing retrieving mechanism has a complex structure and a low degree of automation. Many steps require manual intervention and the retrieving is unstable, and it is easy to cause the material to fall or cause damage.

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