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Detection device and method for narrow-side substrate

A technology for inspecting devices and substrates, which is applied in the direction of measuring devices, measuring device casings, and parts of electrical measuring instruments, etc., can solve the problems of circuit substrate retention, circuit substrate detachment from the clamping mechanism, and inability to use the clamping mechanism, etc., to achieve The Effects of Reliable Electrical Inspections

Active Publication Date: 2019-08-06
尼得科精密检测设备(浙江)有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] However, when the circuit board is a narrow-side board (that is, a circuit board in which the width of the edge portion of the circuit board without wiring and the like is less than 5mm), there are very few parts available for the clamping mechanism to hold, so it is easy to be damaged by the circuit board. There are few clamped parts, and the circuit board may be detached from the clamping mechanism during the inspection operation, and sometimes it may not be possible to use the clamping mechanism to hold the circuit board.

Method used

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  • Detection device and method for narrow-side substrate

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Embodiment Construction

[0052] Below, combined with reference figure 1 An inspection device for a narrow-side substrate according to an embodiment of the present invention will be described, wherein, figure 1 It is a perspective view schematically showing a partial structure of an inspection apparatus for a narrow-side substrate according to an embodiment of the present invention.

[0053] Here, for the convenience of description, let the three directions perpendicular to each other be X direction, Y direction and Z direction, and let one side of the X direction be X1, let the other side of the X direction be X2, and let Y One side of the direction is Y1, the other side of the Y direction is Y2, one side of the Z direction is Z1, and the other side of the Z direction is Z2, and the Z direction corresponds to the vertical direction, The Z1 direction corresponds to the upper side, and the Z2 direction corresponds to the lower side.

[0054] (Structure of inspection device for narrow side substrate) ...

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Abstract

The invention relates to a detection device and method for a narrow-side substrate. The method and device can be used to electrically detect the narrow-side substrate by keeping the narrow-side substrate state stably even if only few part of a detected narrow-side substrate can be clamped. The detector, capable of electrically detecting wires of the circuit substrate with multiple wires, comprisesa detection clamp and a detector body, the detection clamp is mounted in the detector body, and the detector body further comprises a first driving part for driving the detection clamp to move closeto or far from the circuit substrate, and a carrier plate for supporting and positioning the circuit substrate in the vertical direction.

Description

technical field [0001] The invention relates to an inspection device for a narrow-side substrate and an inspection method for a narrow-side substrate. Background technique [0002] Conventionally, inspection jigs such as those disclosed in Patent Document 1 are often used in inspection devices when conducting electrical inspections such as short circuits and open circuits on inspection objects such as circuit boards. [0003] The above-mentioned inspection jig generally includes an inspection side support body, an electrode side support body, a connection member, an electrode mounting part, and a plurality of probes, wherein the connection member connects the inspection side support body to the electrode side with a distance from the electrode side support body. The support body is connected, the electrode mounting part is in contact with the electrode side support body and is arranged on the opposite side of the electrode side support body to the connecting member, and the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R1/04
CPCG01R1/0425G01R31/2812
Inventor 李俊华何幼峰
Owner 尼得科精密检测设备(浙江)有限公司