A power supply device for dut in integrated circuit testing system

A technology for testing systems and integrated circuits, applied in electronic circuit testing, measuring devices, control/regulation systems, etc., and can solve problems such as large power dissipation in power amplifiers

Active Publication Date: 2021-03-30
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to overcome the deficiencies in the prior art, provide a kind of power supply device for DUT in the integrated circuit test system, use the new numerical control DC power supply as the power supply of DUT, thereby solve the power amplifier dissipation in the traditional numerical control DC power supply The problem of too much power, and greatly improved the power amplifier output drive / load capacity

Method used

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  • A power supply device for dut in integrated circuit testing system
  • A power supply device for dut in integrated circuit testing system
  • A power supply device for dut in integrated circuit testing system

Examples

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Embodiment

[0027] For the convenience of description, the relevant technical terms appearing in the specific implementation are explained first:

[0028] DUT (Device Under Test): the device under test;

[0029] MCU (Microprogrammed Control Unit): microcontroller;

[0030] BUCK / BOOST: buck / boost;

[0031] figure 2 It is a schematic diagram of a power supply device for DUT in an integrated circuit test system of the present invention.

[0032] In this example, if figure 2 As shown, the present invention is a kind of power supply device used for DUT in the integrated circuit test system, comprising: PC host computer, controller MCU, isolated buck-boost circuit, power amplifier circuit and voltage / current sampling circuit; Slave controller MCU The voltage / current is output by the power amplifier circuit, then sampled by the voltage / current sampling circuit, and fed back to the controller MCU, thus forming a negative feedback loop.

[0033] image 3 It is a structural diagram of a spe...

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Abstract

The invention discloses a power supply device for DUT in an integrated circuit test system. The PC upper computer sets the preset output value of the system according to the needs of the integrated circuit test system and sends it to the controller MCU. The preset output value controls the chopper circuit to output the corresponding voltage value for the power amplifier, thereby controlling the operation of the integrated circuit test system; when controlling the operation of the integrated circuit test system, the voltage / current sampling circuit collects voltage and current values ​​and feeds them back to the controller MCU, the controller MCU processes the deviation value of the preset output value and the sampling value through the built-in feedback control algorithm, and then controls the output voltage of the BUCK / BOOST chopper circuit through the deviation value, thereby realizing the control and adjustment of the output power accuracy, Reduce the power dissipation of the power amplifier and improve the load driving capability of the power amplifier.

Description

technical field [0001] The invention belongs to the technical field of electronic measuring instruments and integrated circuit testing, and more specifically relates to a power supply device for DUT in an integrated circuit testing system. Background technique [0002] As the basic equipment for military and civilian scientific research and production testing, power supplies are widely used in the power electronics information industry. With the development of science and technology, scientific research and production testing put forward more requirements for the power supply. [0003] Especially, with the development of VLSI, in the integrated circuit test system, the power supply of the device under test DUT in the integrated circuit test system is required to have high power, high precision, high stability, low cost and small size. Aiming at the demand for power supply in the current scientific research and production testing, especially the demand for DUT power supply i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05F1/56G01R31/28
CPCG01R31/2851G05F1/56
Inventor 杨万渝黄俊戴志坚
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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