Logistic regression-based automatic lithological naming method
A technology of logistic regression and logistic regression model, applied in the direction of material inspection products, instruments, electrical digital data processing, etc., can solve the problems of long identification period, low dimension utilization rate, no reference, etc., and achieve scientific naming results and more accurate naming results , the effect of precise naming
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[0028] Below in conjunction with accompanying drawing and specific embodiment the present invention will be described in further detail:
[0029] A kind of automatic lithology naming method based on logistic regression of the present invention comprises the following steps:
[0030] 1) Obtain the mineral composition percentage data of the unidentified layer rock samples through the X-diffraction whole-rock analyzer, and collect the grain size and cement composition and structural characteristics data observed by the naked eye, and establish a single-well X-diffraction whole-rock analysis of mineral composition and structural characteristics Data sheet, as shown in Table 1;
[0031] Table 1 Data table of mineral composition and structural characteristics of single well X-diffraction whole rock analysis (partial data)
[0032]
[0033] 2) collect the data of the rock sample data of existing thin section identification and denomination conclusion and as training set, describe...
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