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Academic growth curve testing method and system

A testing method and testing system technology, applied in character and pattern recognition, instruments, data processing applications, etc., can solve the problems of one-sided judgment of students' growth and easy to ignore students.

Pending Publication Date: 2019-10-18
广州市教育研究院
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Problems solved by technology

[0003] The present invention proposes a method and system for testing the academic growth curve, which solves the problem of judging according to the student's grades or the rise or fall of the grade ranking in the existing judgment standards, which leads to a one-sided judgment on the growth of each student, and it is easy to ignore the difference between the grades of the students. factors other than growth

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Embodiment Construction

[0027] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0028] Such as figure 1 Shown, the present invention proposes a kind of academic growth curve testing method, comprises

[0029] S1, determine the test period of the academic growth curve; the test period can be one week, two weeks, ten days, one month, etc., and can be customized according to the needs of users.

[0030] S2. Obtain information about the scoring factors of each student in the test cycle. The information about the scoring factors includes the stude...

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Abstract

The invention discloses an academic growth curve testing method and system. The academic growth curve testing method comprises the steps of determining an academic growth curve testing period; obtaining related information of scoring factors of each student in the test period, wherein the related information of the scoring factors comprises daily scores, examination scores, expansion activity scores, communication ability scores and examination tendency scores of the students; and calculating scores of the students in the test period according to the weight coefficients of the scoring factors,and fitting an academic growth curve according to the scores of the test periods. According to the invention, comprehensive growth testing is carried out on students by integrating factors of the students in all aspects.

Description

technical field [0001] The invention relates to the technical field of academic performance testing, in particular to a method and system for testing academic growth curves. Background technique [0002] In the existing technology, the detection of students' academic growth is mostly judged according to the student's grades or the rise or fall of the grade ranking, but this kind of judgment standard is one-sided for each student's growth judgment, and it is easy to ignore the students' performance outside the grades. The growth judgment of other factors. Contents of the invention [0003] The present invention proposes an academic growth curve test method and system, which solves the problem of judging according to the student's grades or the rise or fall of the grade ranking in the existing judgment standards, which leads to a one-sided judgment on the growth of each student, and it is easy to ignore the difference between the grades of the students. The problem of growt...

Claims

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Application Information

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IPC IPC(8): G06Q50/20G06K9/00
CPCG06Q50/205G06V40/161G06V40/171
Inventor 方晓波
Owner 广州市教育研究院
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