Method, device and system for power failure test of storage device
A storage device, electrical testing technology, applied in static memory, instruments, etc., can solve the problem of not being able to analyze and formulate power-off protection strategies, and achieve the effect of wide test coverage
Active Publication Date: 2021-09-21
广州匠芯创科技有限公司
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[0004] In order to solve the problem that in the prior art, the method of power-off of the whole system is adopted for the test of the memory, and the power-off protection strategy cannot be analyzed and formulated according to different data processing states, the present invention proposes a method and device for power-off testing of storage devices and system
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[0038] The idea, specific structure and technical effects of the present invention will be clearly and completely described below in conjunction with the implementation examples and accompanying drawings, so as to fully understand the purpose, scheme and effect of the present invention. It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The same reference numbers are used throughout the drawings to indicate the same or similar parts.
[0039] It should be noted that, unless otherwise specified, when a feature is called "fixed" or "connected" to another feature, it can be directly fixed and connected to another feature, or indirectly fixed and connected to another feature. on a feature. In addition, descriptions such as up, down, left, and right used in the application are only relative to the mutual positional relationship of the components of the application in t...
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The invention discloses a storage device power-down testing method, comprising the following steps: A1, respectively writing two different preset characteristic data into at least two different preset storage areas of the storage device to be tested; B1, While writing the characteristic data, monitor the data storage state of the storage device, and when the storage state of the storage device is the first state, cut off the power supply to the storage device, and use at least one preset storage area as a switch Electrical test area; C1. After restoring the power supply to the storage device, the data stored in at least one of at least two different preset storage areas is compared with the preset characteristic data corresponding to the preset storage area. Compared. The testing method of the present invention can obtain the data processing status of the storage device, and then test the corresponding device power-down protection strategy according to the power-down strategy executed by the storage device, and the test coverage is wider.
Description
technical field [0001] The invention relates to a storage device testing method, in particular to a storage device power-down testing method, device and system. Background technique [0002] For storage devices, ensuring reliable storage and stability of data is the focus of its functional attributes, and abnormal power-off testing is an important scenario to verify the reliability of its data storage. When an abnormal power failure occurs, if the power failure protection strategy of the storage device is improperly designed, a large amount of data will be lost, thereby bringing huge economic losses to the provider and user of the storage device. [0003] In the existing storage test power-down test schemes, although there are various test schemes, such as the introduction of test systems, random power-down time, or function growth, etc., when power-down is performed, it is the power-down of the whole system, which cannot be based on Different data processing states are use...
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IPC IPC(8): G11C29/56
CPCG11C29/56
Inventor 王春南黄智盛
Owner 广州匠芯创科技有限公司