Fault classification method based on bidirectional long-short-term memory unit and capsule network
A long-short-term memory and fault classification technology, applied in neural learning methods, biological neural network models, character and pattern recognition, etc., can solve problems such as strong dynamics and data nonlinearity, and achieve the effect of improving accuracy
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[0051] The fault classification method based on the bidirectional long-short-term memory unit and the capsule network of the present invention will be further described in detail below in conjunction with specific implementation methods.
[0052] A kind of fault classification method based on bidirectional long-short-term memory unit and capsule network of the present invention, comprises the following steps:
[0053] Step 1: Obtain a data set consisting of samples x and their labels y of historical industrial continuous processes
[0054] D={X,Y}={(x t ,y t )|t=1,2,...,N}, where X, Y respectively represent the sample set composed of all samples and the corresponding sample label set, y t ∈{1,2,...,C}, t represents the order of samples in the time dimension, N represents the number of samples in the data set, and C is the number of sample categories;
[0055]Step 2: Standardize the training data collected in step 1, convert each variable x of the sample X into a mean value ...
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