Test file generation method, device and electronic device for resistance network
A technology for testing files and resistor networks, which is applied to measuring devices, measuring resistance/reactance/impedance, and measuring electrical variables, etc. It can solve problems such as the inability to obtain test files through the above methods, the inability to test the resistance network of flying probe equipment, and complex structures.
Active Publication Date: 2022-05-06
BEIJING SEMICON EQUIP INST THE 45TH RES INST OF CETC
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In the related art, the test files needed for the flying probe device in the testing process are usually generated based on schematic diagrams such as the circuit diagram of the component to be tested. However, due to the complex structure of some components to be tested, or when it is difficult to obtain the In the case of the schematic diagram, the test file cannot be obtained through the above method, so that the resistance network cannot be tested by the flying probe device
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[0024] The technical solutions of the present invention will be clearly and completely described below in conjunction with the embodiments. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0025] In the related art, the test files that the flying probe device needs to use in the testing process are usually generated based on the circuit diagram of the component to be tested. However, due to the complex structure of some components to be tested; such as three-dimensional connectors, etc., three-dimensional connectors It is a ceramic multilayer three-dimensional circuit substrate, on which pad pins are distributed on planes with different heights, and pad pins are used for circuit connection between electroni...
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The invention provides a resistance network test file generation method, device and electronic equipment. After obtaining the components to be tested, the geometric coordinate information of the point to be measured is obtained through the flying probe device and the image acquisition device; and according to the geometric coordinate information and the pre-acquired The network relationship of the test points can generate the test file of the component under test. The invention can obtain the test file of the component to be tested with complex structure or whose schematic diagram cannot be obtained, so as to realize the test of the resistance network of the component to be tested through the flying probe device.
Description
technical field [0001] The invention relates to the technical field of electronic circuits, in particular to a test file generation method, device and electronic equipment for a resistance network. Background technique [0002] Flying probe equipment (also known as a testing machine) is used to test the resistance network of circuit boards or other electronic components, mainly to test the insulation and conduction value of circuit boards. In the related art, the test files needed for the flying probe device in the testing process are usually generated based on schematic diagrams such as the circuit diagram of the component to be tested. However, due to the complex structure of some components to be tested, or when it is difficult to obtain the In the case of the schematic diagram, the test file cannot be obtained through the above method, so that the resistance network cannot be tested by the flying probe device. Contents of the invention [0003] In view of this, the pu...
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IPC IPC(8): G01R27/02
CPCG01R27/02
Inventor 左宁党景涛高慧莹
Owner BEIJING SEMICON EQUIP INST THE 45TH RES INST OF CETC