A simulation test method and device

Abstract

Embodiments of the present invention provide a simulation test method and device, the method comprising: the first simulation module determines the first test parameters based on user operations, and generates a first simulation signal according to the first test parameters; The module sends the first test parameter; the second simulation module determines the second test parameter according to the first test parameter, and generates the second simulation signal according to the second test parameter; the first simulation module sends the first simulation signal to the train control center, and The second simulation module sends the second simulation signal to the train control center to perform a simulation test on the train control center. In this way, the user only needs to operate the first simulation module once, and the second simulation module can still determine the second test parameters without user operation, and then generate the second simulation signal and send it to TCC, which can avoid repeated operations by the user , improve the simulation test efficiency.

Description

technical field [0001] The invention relates to the technical field of railway signal testing, in particular to a simulation testing method and device. Background technique [0002] As an important infrastructure, railway plays a vital role in the development of national economy. In order to ensure the safety of railway transportation, the Chinese Train Control System (CTCS) came into being. CTCS mainly includes: vehicle subsystem and ground subsystem. The ground subsystem includes: transponder, track circuit, wireless communication network, train control center (Train Control Center, TCC) and so on. Among them, the normality of TCC plays a very important role in the normal operation of CTCS. Therefore, it is necessary to conduct a simulation test on the TCC to determine whether the TCC is normal. [0003] The non-insulated frequency-shifting automatic blocking track circuit (ZPW) simulation and signal relay simulation are indispensable means for testing TCC. When it is...

AI Technical Summary

Problems solved by technology

In this way, it is necessary to set the section state twice on the station map, which makes the operation repeated and reduces the efficiency of the simulation test

Moreover, two test environments need to be built for ZPW simulation and signal relay simulation, which increases the repetition of test environment construction and is not convenient for the maintenance of later test environments

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