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A Chinese test paper layout analysis method and system

A technology of layout analysis and test papers, applied in neural learning methods, instruments, biological neural network models, etc., can solve the problems that cannot well solve the needs of Chinese test paper analysis, and achieve the effect of improving the efficiency of automatic correction

Active Publication Date: 2022-06-17
上海光未远科技有限公司
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Problems solved by technology

[0003] The purpose of the embodiment of the present invention is to provide a Chinese test paper layout analysis method and system to solve the defects in the prior art that cannot well solve the Chinese test paper analysis requirements

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  • A Chinese test paper layout analysis method and system
  • A Chinese test paper layout analysis method and system

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Embodiment Construction

[0052] In order to make the technical problems, technical solutions and advantages to be solved by the present invention clearer, the following detailed description will be given in conjunction with the accompanying drawings and specific embodiments. The following embodiments are used to illustrate the present invention, but not to limit the scope of the present invention.

[0053] refer to figure 1 As shown, a method for analyzing the layout of a Chinese test paper, the method includes:

[0054] S101, construction of a data set; wherein, the data set includes test papers in multiple languages ​​or test paper images in literature.

[0055] Specifically, the data set is a set of test paper images that provide a language test paper, which further includes label settings for the language test paper, and the labels include a question label and an answer label;

[0056] Topic labels include titles, multiple-choice questions, fill-in-the-blank questions, and essay questions (the es...

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Abstract

The invention discloses a method and system for analyzing the layout of a Chinese test paper. The method includes: constructing a data set; wherein, the data set includes multiple language test papers or test paper images in documents; and the test paper images in the data set are Carry out image preprocessing; perform image recognition and analysis on the preprocessed image based on the trained deep learning network to obtain the recognition result and then realize the matching of the question and the answer; wherein, the recognition result includes the recognition and positioning of the question content and each The answer positioning and answer extraction corresponding to the question; the effect is: through the application of image processing and deep learning network, the content of the question in the Chinese test paper is recognized, and the matching of the corresponding question and answer is realized according to different questions, which is very good It solves the needs of Chinese test paper analysis and lays the foundation for the subsequent effective improvement of the automatic correction efficiency of Chinese test papers.

Description

technical field [0001] The invention relates to the technical field of image processing of test papers, in particular to a method and system for analyzing the layout of a language test paper. Background technique [0002] With the rise of artificial intelligence, it has also made great achievements in the education industry. Teachers or teaching staff need to invest a lot of time in correcting test papers. Therefore, intelligent automatic correction has become a very promising and marketable direction in the education industry. Layout analysis is the basis of intelligent automatic correction, and it is also an important and indispensable preliminary work. The layout analysis of Chinese has its own complex characteristics. For example, it basically does not contain formulas, and may contain unique composition questions. However, in the prior art, the use of a general segmentation framework and data set cannot well meet the needs of Chinese test paper analysis. SUMMARY OF TH...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06V30/414G06V30/418G06V30/19G06V30/148G06V10/82G06K9/62G06N3/04G06N3/08
CPCG06V30/414G06V30/418G06V10/267G06F18/22
Inventor 周鸿姚璐
Owner 上海光未远科技有限公司