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Plate strip surface defect analysis system

A defect analysis, strip technology, applied in the field of strip rolling, can solve the problem that the surface inspection system cannot trace and analyze surface defects, and achieve the effects of avoiding differences, improving precision, and improving efficiency

Pending Publication Date: 2020-11-10
BEIJING SHOUGANG CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present invention provides a surface defect analysis system for plates and strips to solve or partially solve the technical problem that the existing surface detection system cannot trace and analyze surface defects between multiple units

Method used

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  • Plate strip surface defect analysis system
  • Plate strip surface defect analysis system
  • Plate strip surface defect analysis system

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Embodiment Construction

[0036] In order to enable those skilled in the technical field to which the application belongs to understand the application more clearly, the technical solutions of the application will be described in detail below through specific embodiments in conjunction with the accompanying drawings. Throughout the specification, unless otherwise specified, terms used herein should be understood as commonly used in the art. Therefore, unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. In case of conflict, this specification shall take precedence. Unless otherwise specified, various equipment used in the present invention can be purchased from the market or prepared by existing methods.

[0037] Based on the problem that the existing surface quality inspection system cannot trace the associated defects of the front and rear units, this application is d...

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Abstract

The invention discloses a plate strip surface defect analysis system. The system comprises an original data layer, a defect analysis layer and a result display layer, The original data layer is used for storing surface defect original data acquired from a control system; the defect analysis layer determines a selected defect, a selected plate roll corresponding to the selected defect and a selected unit to which the selected defect belongs according to defect selection operation, and determines a defect corresponding to the selected defect when the selected plate roll is produced by a preceding unit and / or a subsequent unit of the selected unit according to the surface defect original data; the result display layer displays defect tiled drawings of the selected plate roll in the selected unit and the previous unit and / or the subsequent unit in the first display area, and marks corresponding defects of the selected defects on the defect tiled drawings of the previous unit and / or the subsequent unit; according to the system, cross-unit rapid association and tracing of corresponding defects of selected defects are achieved, and the plate roll surface quality control efficiency is improved.

Description

technical field [0001] The present application relates to the technical field of strip rolling, in particular to a surface defect analysis system for strips. Background technique [0002] In the field of strip rolling, the surface quality control of strips has always been the key to product quality, and with the rapid development of the industry, the competition for product homogeneity has become increasingly fierce, and customers' requirements for product surface quality have gradually increased. In the strip rolling production process, the strip usually passes through multiple production lines, and each production line may introduce surface quality defects, and the surface quality produced by the previous production line will evolve during the production process of the subsequent production line Therefore, to control the product surface quality of the plate and strip, it is necessary to analyze the whole process in order to clarify the specific causes of defects and improv...

Claims

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Application Information

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IPC IPC(8): G01N21/95G01N21/88G06T7/00
CPCG01N21/8851G01N21/95G06T7/0004G06T2207/30108G01N2021/8887
Inventor 付光马家骥于洋颜晨曦于浩淼陈斌龚坚焦会立
Owner BEIJING SHOUGANG CO LTD
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