IC card testing method, device, system and computer-readable storage medium
A technology for testing equipment and card testing, applied in the field of smart card testing, can solve problems such as low testing efficiency, and achieve the effect of improving testing efficiency
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0048]It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.
[0049]The main solution of the embodiment of the present invention is: obtain the test case corresponding to the target transaction device; read the first transaction information of the IC card to be tested according to the test case, and use the first transaction information to execute the transaction operation; The transaction result of the transaction operation output by the test case determines the compatibility evaluation parameter between the IC card to be tested and the target transaction device.
[0050]In the prior art, for every new type of card development, it is necessary to arrange personnel to swipe the card at the transaction equipment site to complete the IC card compatibility test, and the transaction equipment used by the IC card is distributed in different places, resulting in test efficiency Very low.
[005...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 


