Electronic component operation device and operation classification equipment applying same

Abstract

The invention discloses an electronic component operation device and operation classification equipment applying the same, the electronic component operation device comprises an operator and an acknowledgement mechanism, the acknowledgement mechanism is provided with a bearing unit, a fastening unit and a driving unit, the bearing unit is used for assembling the operator through a first bearing tool, a second bearing tool is arranged in an operation area, and the fastening unit is used for fastening the operator through the second bearing tool. The fastening unit is provided with a first acknowledgement tool on the first bearing tool and a second acknowledgement tool on the second bearing tool, the first acknowledgement tool and the second acknowledgement tool are provided with a first fastening component and a second fastening component which can be fastened with each other, and the driving unit is provided with a driving source for driving the first acknowledgement tool or the secondacknowledgement tool to rotate. Therefore, the first buckling part of the first determining tool and the second buckling part of the second determining tool are mutually buckled so as to prevent thewhole operation device from being pushed reversely by the electronic element to move, the operation device is enabled to execute preset operation on the electronic element indeed, and the practical benefit of improving the operation quality is achieved.

Description

technical field [0001] The invention provides an operation device which can make an operation device execute a preset operation on electronic components, thereby improving the operation quality. Background technique [0002] Nowadays, the number of contacts of electronic components is increasing day by day, ranging from a few to dozens. Correspondingly, the test socket of the operating device must also be equipped with the same number of probes to electrically contact the contacts of electronic components; There is a spring inside the needle. In order to make electrical contact between the contact point of the electronic component and the probe of the test socket, the operating device must make a crimping device press the electronic component with a pressure, so that the electronic component compresses the probe. However, the excessive or insufficient down force of the crimper will affect the quality of the test. For example, when the electronic component has dozens of conta...

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Problems solved by technology

[0003] see figure 1 , is a schematic diagram of the test seat 11 and the crimping device 12 of the operating device, the test seat 11 is provided with a plurality of probes 111, and is electrically connected to a circuit board 13 to test electronic components; the crimping device 12 is assembled on the moving arm 14 , to transfer the electronic component 15 to be tested to the test socket 11, the interior of the crimping device 12 is provided with a diaphragm 121, an air chamber 122 and a pressing fixture 123, etc. After the gas is injected into the chamber 122, the diaphragm 121 protrudes and deforms downward, and pushes the pressing jig 123 to move downward in the Z direction to press down the electronic component 15, so that the electronic component 15 can perform the test operation in the test seat 11; But because the springs (not shown) of tens of probes 111 of test socket 11 are compressed, tens of probes 111 will produce a larger reaction force to electronic component 15, this larger reaction force Pushing through the electronic component 15 drives the crimping device 12 to reversely displace in the Z direction, resulting in the problem that the crimping device 12 cannot be pressed against the electronic component 15 with the preset downward force, so that some contacts of the electronic component 15 The probe 111 of the test socket 11 cannot be reliably contacted, thereby affecting the test quality of the electronic components

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