Electromagnetic detection probe for deep defects of metal component based on TMR magnetoresistive sensor array

Abstract

The invention discloses an electromagnetic detection probe for deep defects of a metal component based on a TMR magnetoresistive sensor array, and belongs to the field of detection. The probe comprises a rectangular double-layer printed TMR circuit board, a TMR magnetoresistive sensor group, a TMR array detection element, a first coil framework, a second coil framework, a first rectangular excitation coil, a second rectangular excitation coil, a probe main shell and a probe auxiliary shell, the TMR array detection element is installed at the geometric center position of the first rectangular excitation coil and the second rectangular excitation coil. The scanning direction of the electromagnetic detection probe is perpendicular to the arrangement direction of the TMR array detection elements. The TMR magnetoresistive sensor group is selected to replace a conventional coil probe, the bottleneck that a conventional eddy current coil probe cannot detect deep defects is broken through, thesurface, sub-surface and deep defects of a non-ferromagnetic material component can be detected, the surface, sub-surface and deep defects of a ferromagnetic material component can also be detected,the detection depth and sensitivity are greatly improved, The probe is simple in structure, convenient to operate, stable in performance and high in measurement precision.

Description

technical field [0001] The invention belongs to the field of electromagnetic non-destructive testing, in particular to an electromagnetic detection probe for detecting deep defects of metal components. Background technique [0002] Eddy current testing is a non-destructive testing method using the principle of electromagnetic induction. The induced magnetic field associated with the eddy current inside the conductor of the tested workpiece is superimposed on the original magnetic field, which makes the complex impedance amplitude and phase of the detection coil change. By analyzing the impedance change of the detection coil , can obtain the internal structure of the tested piece, material distribution, whether there are defects and other information. [0003] At present, both the excitation end and the receiving end of the eddy current inspection use coil-wound detection probes. Due to the influence of the skin effect, reducing the excitation frequency will cause the sensiti...

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Problems solved by technology

[0003] At present, both the excitation end and the receiving end of the eddy current inspection use coil-wound detection probes. Due to the influence of the skin effect, reducing the excitation frequency will cause the sensitivity of the probe to be greatly weakened, and it is powerless to detect deep defects of the inspected part, which has become a bottleneck restricting the development of eddy current inspection.

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