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Defect information processing system and method for test object

An information processing system and information processing method technology, applied in the field of information processing, can solve problems such as long waiting time, information flow, and low processing efficiency

Pending Publication Date: 2021-02-26
TAIKANG LIFE INSURANCE CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Defect information cannot be transferred across R&D, testing, and operation and maintenance platforms, nor can it be transferred between R&D systems in the R&D platform. It can only be transferred one-to-one through the test system and R&D system, resulting in long waiting times and low processing efficiency

Method used

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  • Defect information processing system and method for test object
  • Defect information processing system and method for test object
  • Defect information processing system and method for test object

Examples

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Embodiment Construction

[0048] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. Apparently, the described embodiments are some, but not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0049]Before a new version of a product is launched or released, technical teams and technical leaders in different positions need to work together. For example, technical teams in different positions can include requirements team, R&D team, and testing team, and technical leaders in different positions can include product managers, R&D managers, and problem managers. Among them, the demand team is responsible for preliminary rese...

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Abstract

The embodiment of the invention provides a defect information processing system and method for a test object. The system comprises a test platform used for sending defect information for the test object to a research and development platform; the research and development platform is integrated with a plurality of research and development systems and is used for receiving defect information aimingat a test object and sending the defect information aiming at the test object to the research and development systems; the research and development system is used for acquiring feedback information for the defect information and sending the feedback information to the test platform through the research and development platform; the operation and maintenance platform is used for receiving problem information generated by the test platform according to feedback information of the plurality of research and development systems, wherein the problem information is used for indicating and confirmingwhether the test object has a production problem. According to the invention, the defect information can be transferred across research and development platforms, test platforms and operation and maintenance platforms, and can also be transferred among research and development systems in the research and development platforms, so that the waiting time is reduced, the processing efficiency is improved, and the historical problem of unmanned tracking of production problems is solved.

Description

technical field [0001] The invention relates to the technical field of information processing, in particular to a defect information processing system and method of a test object. Background technique [0002] The release of a new version of a product needs to be tested by multiple R&D teams and the testing team. Generally speaking, when the test team finds that there are defects in the new version of the product, it needs to create new defect information and send it to one of the R&D systems, and the R&D team of the R&D system will handle the defects. [0003] However, when the R&D team finds that the defect is not a defect of the R&D system, it returns the defect information to the test system, and the test system needs to create new defect information and send it to another R&D system until the source of the defect is found to deal with the defect. Defect information cannot be transferred across R&D, testing, and operation and maintenance platforms, nor can it be transfe...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06Q10/00
CPCG06F11/3688G06F11/3684G06Q10/20
Inventor 黄泰霖
Owner TAIKANG LIFE INSURANCE CO LTD
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