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Pen electric shell defect rapid detection algorithm

A detection algorithm and shell technology, applied in the field of image recognition, can solve problems such as low inspection efficiency, inspection methods relying on human eye judgment, etc., to achieve the effect of improving efficiency

Pending Publication Date: 2021-04-23
重庆宇海精密制造股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, the existing inspection methods rely on human judgment, and the inspection efficiency is low.

Method used

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  • Pen electric shell defect rapid detection algorithm
  • Pen electric shell defect rapid detection algorithm
  • Pen electric shell defect rapid detection algorithm

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Embodiment Construction

[0034] In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments It is a part of the embodiments of this application, not all of them. The components of the embodiments of the application generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations.

[0035] Accordingly, the following detailed description of the embodiments of the application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely represents selected embodiments of the application. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art w...

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Abstract

The invention relates to a pen electric shell defect rapid detection algorithm, which comprises the following steps: respectively collecting a to-be-detected image of a to-be-detected pen electric shell and a standard template image of a defect-free pen electric shell, intercepting partial images for comparison in the to-be-detected image and the standard template image, and converting the partial images into a two-dimensional array containing gray values; correspondingly projecting a part of the image intercepted to the standard template image into an image to be detected through coarse positioning and accurate positioning, performing sum-difference operation to find out different positions in the part of the image, and finally performing traversal comparison to obtain a target image. Whether the to-be-detected image of the to-be-detected pen electric shell is different from the standard template image of the defect-free pen electric shell or not can be found out, so that whether the notebook computer shell has defects or not is automatically judged, and the defect detection efficiency of a notebook computer shell is improved.

Description

technical field [0001] The invention relates to the technical field of image recognition, in particular to a fast detection algorithm for defects in a laptop case. Background technique [0002] During the assembly process of the notebook computer, it is necessary to judge the integrity of the notebook computer shell, otherwise it is easy to cause the parts to not be assembled during the assembly process, resulting in damage to the parts and the shell during the assembly process. Therefore, in the notebook computer assembly process, it is necessary to first Inspect the case of the laptop for defects. [0003] However, the existing inspection methods rely on human eyes to judge, and the inspection efficiency is low. Contents of the invention [0004] In view of this, the object of the present invention is to provide a fast detection algorithm for the defect of the notebook computer case, so as to improve the efficiency of defect inspection of the case of the notebook comput...

Claims

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Application Information

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IPC IPC(8): G06T7/00G06T7/13
Inventor 刘子平韦世强
Owner 重庆宇海精密制造股份有限公司
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