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A ct secondary loop deviation rate measuring device

A technology for measuring devices and secondary circuits, applied to measuring devices, measuring device casings, measuring electrical variables, etc., can solve laborious and troublesome problems, and achieve the effect of improving test efficiency

Active Publication Date: 2022-07-15
STATE GRID CORP OF CHINA +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Publication number: CN202494774U discloses a resistance deviation rate measuring instrument for error correction. We found that this kind of tester needs to be carried by the operator when it is transported to the target test position, which is laborious. In addition, due to the different heights of the test target points, the user Sometimes it is necessary to test with the probe end while carrying the deviation rate measuring instrument, which is troublesome

Method used

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  • A ct secondary loop deviation rate measuring device
  • A ct secondary loop deviation rate measuring device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0015] A CT secondary circuit deviation rate measurement device, such as Figure 1-Figure 2 As shown, it includes a buffer cart. The buffer cart includes a U-shaped elastic plate 13. Four universal wheels 7 are installed at the bottom of the U-shaped elastic plate 13. The fixed end of the universal wheel 7 is matched with the U-shaped elastic plate 13. The upper part of the elastic plate 13 is connected to the base 5, and the upper part of the base 5 is installed with a lifting test device. The lifting test device includes a guide rod 2, and the lower end of the guide rod 2 is connected with the base 5. The guide rod 2 is covered with a sleeve 3, and the sleeve 3 can slide on the guide rod 2, one side of the sleeve 3 is provided with a screw hole, the sleeve 3 is threadedly connected to the first bolt 4 through the screw hole, the first bolt 4 can lock the sleeve 3 and the guide rod 2, the sleeve 3 One side of the box is connected to the box 1, and the inside of the box 1 is c...

Embodiment 2

[0019] A CT secondary circuit deviation rate measurement device, such as Figure 1-Figure 2 As shown, it includes a buffer cart. The buffer cart includes a U-shaped elastic plate 13. Four universal wheels 7 are installed at the bottom of the U-shaped elastic plate 13. The fixed end of the universal wheel 7 is matched with the U-shaped elastic plate 13. The upper part of the elastic plate 13 is connected to the base 5, and the upper part of the base 5 is installed with a lifting test device. The lifting test device includes a guide rod 2, and the lower end of the guide rod 2 is connected with the base 5. The guide rod 2 is covered with a sleeve 3, and the sleeve 3 can slide on the guide rod 2, one side of the sleeve 3 is provided with a screw hole, the sleeve 3 is threadedly connected to the first bolt 4 through the screw hole, the first bolt 4 can lock the sleeve 3 and the guide rod 2, the sleeve 3 One side of the box is connected to the box 1, and the inside of the box 1 is c...

Embodiment 3

[0022] A CT secondary circuit deviation rate measurement device, such as Figure 1-Figure 2 As shown, it includes a buffer cart. The buffer cart includes a U-shaped elastic plate 13. Four universal wheels 7 are installed at the bottom of the U-shaped elastic plate 13. The fixed end of the universal wheel 7 is matched with the U-shaped elastic plate 13. The upper part of the elastic plate 13 is connected to the base 5, and the upper part of the base 5 is installed with a lifting test device. The lifting test device includes a guide rod 2, and the lower end of the guide rod 2 is connected with the base 5. The guide rod 2 is covered with a sleeve 3, and the sleeve 3 can slide on the guide rod 2, one side of the sleeve 3 is provided with a screw hole, the sleeve 3 is threadedly connected to the first bolt 4 through the screw hole, the first bolt 4 can lock the sleeve 3 and the guide rod 2, the sleeve 3 One side of the box is connected to the box 1, and the inside of the box 1 is c...

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Abstract

A CT secondary circuit deviation rate measuring device, comprising a buffer cart, the buffer cart comprises a U-shaped elastic plate, four universal wheels are installed at the bottom of the U-shaped elastic plate, and the fixed end of the universal wheel is matched with the U-shaped elastic plate , The upper part of the U-shaped elastic plate is connected to the base, and the upper part of the base is equipped with a lifting test device. The invention combines the lower test device and the buffer cart to facilitate the operator to push the deviation tester to the target position. When the test point is high, The user can manually lift the box close to the target test position, and then use the first bolt to lock the sleeve and the guide rod, so that the box and the deviation tester can be locked in height, which is convenient for the operator to test and improves the test efficiency. The U-shaped elastic plate of the present invention can buffer the upper structure of the U-shaped elastic plate in the process of pushing the device to travel, thereby helping to protect the deviation tester.

Description

technical field [0001] The invention relates to a measuring device, more specifically, a CT secondary circuit deviation rate measuring device. Background technique [0002] Publication number: CN202494774U discloses an error-corrected resistance deviation rate measuring instrument. We found that this kind of tester needs to be carried by the operator when it is transported to the target test position, which is relatively laborious. In addition, due to the different heights of the test target points, users Sometimes it is necessary to carry the deviation rate measuring instrument while using the probe to test, which is troublesome. SUMMARY OF THE INVENTION [0003] The purpose of the present invention is to provide a CT secondary loop deviation rate measurement device, which can be combined with a lowering test device and a buffer cart, which can facilitate the operator to push the deviation tester to the target position. When the test point is high, the user can The box b...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/02G01R1/04
CPCG01R27/02G01R1/0408
Inventor 丁晶田智勇董海波康亚东刘国伟张良郭百艳徐亚男徐奎公李从洋李新涛吕莹孙晓勇张帅郑云丹
Owner STATE GRID CORP OF CHINA