Test point positioning method and device, equipment and readable storage medium

Abstract

The invention discloses a test point positioning method and device, equipment and a readable storage medium. The test point positioning method comprises the steps of: acquiring an input signal and component number information on a circuit board, wherein the input signal corresponds to the component number information; positioning all wiring points connected with the input signal based on the input signal; based on the component number information and the wiring points, determining first position information representing the position of a component and second position information representing the positions of the wiring points; based on the first position information and the second position information, selecting wiring point information meeting a preset condition from the second position information; and based on the selected wiring point information, determining a test point meeting a preset requirement. According to the test point positioning method and the device, the appropriate test points are automatically obtained through the parameters of the components on the circuit board, the process does not need experienced testers, and the finally selected test points are not subjectively influenced by different testers, so that the final test quality is stable, and the subsequent test result comparison is not influenced.

Description

technical field [0001] The invention relates to the technical field of electronic circuits, in particular to a test point positioning method, device, equipment and readable storage medium. Background technique [0002] Existing circuit boards need to be tested. The test includes the voltage test of electrical components. In the prior art, finding the best test point is realized through the complex operation and rich experience of the tester. The level requirements are high, the test efficiency is low, the test points selected by different testers are relatively random, and the test quality is unstable, which will have a great impact on the comparison of test results in the future. Contents of the invention [0003] The embodiment of the present invention provides a test point positioning method, device, equipment and readable storage medium, which is free from the subjective influence of different testers, thereby making the final test quality stable and not affecting the ...

AI Technical Summary

Problems solved by technology

[0002] Existing circuit boards need to be tested. The test includes the voltage test of electrical components. In the prior art, finding the best test point is realized through the complex operation and rich experience of the tester. The level requirements are high, the test efficiency is low, the test points selected by different testers are relatively random, and the test quality is unstable, which will have a great impact on the comparison of test results in the future

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