A test point positioning method, apparatus, device and readable storage medium

Abstract

The invention discloses a test point positioning method, device, equipment and readable storage medium, comprising: acquiring input signal and component number information on a circuit board, wherein the input signal corresponds to the component number information; based on the input signal, Locate all the wiring points connected to the input signal; based on the component number information and the wiring points, determine the first position information representing the position of the component and the second position information representing the location of the wiring point; based on the first position information and the second position information, and select the connection point information that meets the preset condition from the second position information; and determine the test point that meets the preset requirement based on the selected connection point information. This solution automatically obtains the appropriate test points through the component parameters on the circuit board. This process does not require experienced testers, and the final selected test points are not subject to the subjective influence of different testers, thereby making the final test quality. It is stable and does not affect the comparison of future test results.

Description

technical field [0001] The present invention relates to the technical field of electronic circuits, and in particular, to a test point positioning method, device, device and readable storage medium. Background technique [0002] Existing production circuit boards need to be tested, including voltage testing of electrical components. In the prior art, finding the best test point is achieved through the complex operation of the tester and the rich experience. The level requirements are high, the test efficiency is low, the test points selected by different testers are random, and the test quality is unstable, which has a great impact on the comparison of future test results. SUMMARY OF THE INVENTION [0003] Embodiments of the present invention provide a test point positioning method, device, device and readable storage medium, which are not subject to the subjective influence of different testers, thereby making the final test quality stable and not affecting the comparison...

AI Technical Summary

Problems solved by technology

[0002] Existing circuit boards need to be tested. The test includes the voltage test of electrical components. In the prior art, finding the best test point is realized through the complex operation and rich experience of the tester. The level requirements are high, the test efficiency is low, the test points selected by different testers are relatively random, and the test quality is unstable, which will have a great impact on the comparison of test results in the future

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