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Plasma mirror single signal-to-noise ratio improvement degree measurement method and device based on the synchronous chirp probe pulse

A technology of plasma and chirped pulses, applied in the field of ultrashort pulse measurement, to achieve the effect of single signal-to-noise ratio improvement measurement, single measurement, and easy integration

Active Publication Date: 2021-06-04
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

[0004] Aiming at the problems of current ultra-short and ultra-intense laser pulse plasma mirror signal-to-noise ratio measurement technology, the present invention provides a plasma mirror single signal-to-noise ratio improvement measurement device based on synchronous chirped probe pulses and

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  • Plasma mirror single signal-to-noise ratio improvement degree measurement method and device based on the synchronous chirp probe pulse

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Embodiment Construction

[0030] In order to make the implementation purpose, technical solution and technical effect of the present invention clearer, the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments. In the description of the present application, it should be understood that the orientation or positional relationship indicated by the terms "front", "rear", "right", "upper", "vertical", etc. is based on the orientation or positional relationship shown in the drawings , is only for the convenience of describing the present application and simplifying the description, but does not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the present application.

[0031] This embodiment provides a single signal-to-noise ratio improvement measurement device for plasma mirrors...

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Abstract

According to a plasma mirror single signal-to-noise ratio improvement degree measurement method and device based on the synchronous chirp probe pulse, the synchronous chirp pulse serves as the probe pulse, the chirp characteristic of the synchronous chirp pulse is utilized, the reflectivity change of the plasma mirror is converted into the spectral change of the chirp pulse, and by measuring the spectral change of a chirp pulse light source, the single signal-to-noise ratio improvement degree measurement of the plasma mirror is realized. The method has the advantages of single measurement, simplicity and convenience in operation, no need of main laser sampling, solving of the problem that a delay scanning type method needs multiple measurements and the problem of measurement light intensity required by a nonlinear effect in a traditional three-order cross-correlation measurement method, facilitation of measurement of the single signal-to-noise ratio improvement degree of the plasma mirror, and the method has an important application background in a high-power ultra-short pulse system using a plasma mirror.

Description

technical field [0001] The invention belongs to the field of ultrashort pulse measurement, and in particular relates to a method and device for measuring a single signal-to-noise ratio improvement degree of a plasma mirror. Background technique [0002] With the rapid development of femtosecond laser technology and chirped pulse amplification (CPA). The focused power density of lasers is getting higher and higher, which promotes the development of various scientific researches, including fast ignition of inertial confinement fusion, laser-driven particle acceleration and diagnosis of high power density plasma. Relatively, higher requirements are put forward for laser contrast. Among them, the plasma mirror is very suitable for the terminal signal-to-noise ratio improvement of high-power ultrashort pulses due to its characteristics of no fear of damage and good signal-to-noise ratio improvement. [0003] For plasma mirrors, the improvement of signal-to-noise ratio is an imp...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J11/00
CPCG01J11/00Y02E30/10
Inventor 朱坪张栋俊梁彦易友建谢兴龙朱健强
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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